{"labels":{"en":"Design–Reliability Flow and Advanced Models Address IC-Reliability Issues"},"descriptions":{"en":"scientific paper published in CEUR-WS Volume 1566"},"claims":{"P31":"Q13442814","P1433":"Q113544430","P1476":{"text":"Design–Reliability Flow and Advanced Models Address IC-Reliability Issues","language":"en"},"P407":"Q1860","P953":"https://ceur-ws.org/Vol-1566/Paper1.pdf","P50":[],"P2093":[{"value":"Mohamed Selim","qualifiers":{"P1545":"1"}},{"value":"Eric Jeandeau","qualifiers":{"P1545":"2"}},{"value":"Cyril Desclèves","qualifiers":{"P1545":"3"}}]}}