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        <article-title>Reducing Sequential Diagnosis Costs by Modifying Reiter's Hitting Set Tree</article-title>
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        <contrib contrib-type="author">
          <string-name>Patrick Rodler</string-name>
          <xref ref-type="aff" rid="aff0">0</xref>
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        <contrib contrib-type="author">
          <string-name>Manuel Herold</string-name>
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        <contrib contrib-type="author">
          <string-name>Extended Abstract</string-name>
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        <aff id="aff0">
          <label>0</label>
          <institution>Alpen-Adria Universität Klagenfurt</institution>
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      <p>When systems such as software, physical devices or
knowledge bases do not exhibit required properties, there is often
a substantial number of competing fault explanations,
called diagnoses. Sequential Diagnosis aims at suggesting a
minimal-cost sequence of measurements to identify the root
cause of a system failure, i.e. the diagnosis that pinpoints
the actually faulty system components. Since the
minimization of the overall measurement costs is NP-hard, sequential
diagnosis methods rely on local optimizations to
approximate the optimal sequence of measurements. To this end,
an iteratively (re-)computed set of (e.g., the most probable)
diagnoses usually serves as a decision basis for the selection
of the best next measurement. The computation of
diagnoses is often accomplished by hitting set algorithms, due
to their favorable properties in terms of general
applicability, independence of specific theorem provers, and ability
to generate diagnoses in best-first order.</p>
      <p>In this work, we argue that sequential diagnosis can be
interpreted in two natural ways, as a static (StatSD) or
dynamic (DynSD) problem, and that existing methods focus
only on the latter. Both problem formulations assume a
diagnosis problem instance (DPI)—consisting of knowledge
about the system, its components, and the so-far made
observations and measurements—being given as an input. The
main difference between DynSD and StatSD is the way how
new measurements are taken into account. In DynSD, they
are directly used to extend (the measurements set of) the
DPI, i.e., the relevant DPI is dynamically changing
throughout the sequential process, each time shifting the focus to
the diagnoses space of the extended DPI. StatSD, in
contrast, assumes the (initial) DPI is static and does not add
new measurements to it. Instead, it uses the measurements
as constraints to prune the, quasi “frozen”, search space of
diagnoses for the fixed DPI.</p>
      <p>We prove that, under certain conditions, solving StatSD
leads to a lower expected number of measurements
compared to DynSD. In general, however, StatSD in
incomplete and gives no guarantee that the actual diagnosis will
be found, as opposed to DynSD. Hence, DynSD and StatSD
can be seen as two extremes of a generalized view on
sequential diagnosis; on the one extreme, new information is
always used to switch to a new DPI (implying
completeness), whereas, on the other extreme, new information is
never used to switch to a new DPI (implying less
measurement costs).</p>
      <p>To combine the benefits of both strategies, we introduce
a novel variant of Reiter’s hitting set algorithm that
implements this generalized sequential diagnosis process where
DPI-switches can take place anytime, while guaranteeing
completeness. Supporting our theoretical results, empirical
examinations using real-world problems reveal that the new
algorithm—even with a fairly simple DPI-switching
strategy based on the search tree size—substantially reduces the
required effort to locate the actual diagnosis, compared to
(sound and complete best-first) diagnoses computation
algorithms that switch DPIs in every iteration. In concrete
figures, an average of 20% and up to 65% of the user
interaction cost to diagnose the system could be saved and
the new strategy led to equal or lower measurement costs
in 97% of the cases. Moreover, the proposed algorithm is
as generally applicable as Reiter’s method as well as fully
compatible and able to synergize with other measurement
selection approaches or optimization heuristics such as
entropy.</p>
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