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  <front>
    <journal-meta />
    <article-meta>
      <title-group>
        <article-title>A Mathematical Model of Microsurface Normal Distribution for Specular Bidirectional Reflectance Distribution Function</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <string-name>Ivan Dychka</string-name>
          <email>dychka@pzks.fpm.kpi.ua</email>
          <xref ref-type="aff" rid="aff0">0</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Yevgeniya Sulema</string-name>
          <email>sulema@pzks.fpm.kpi.ua</email>
          <xref ref-type="aff" rid="aff0">0</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Constantine Rudenko</string-name>
          <xref ref-type="aff" rid="aff0">0</xref>
        </contrib>
        <aff id="aff0">
          <label>0</label>
          <institution>Faculty of Applied Mathematics, Igor Sikorsky Kyiv Polytechnic Institute</institution>
          ,
          <addr-line>Ukraine, Kyiv, 37 Peremohy ave.</addr-line>
        </aff>
      </contrib-group>
      <pub-date>
        <year>2018</year>
      </pub-date>
      <fpage>1</fpage>
      <lpage>3</lpage>
      <abstract>
        <p>This paper presents a new mathematical model of microsurface normal distribution. The proposed model retains a long highlight tail even with roughness coefficient extremely close to zero which matches the behavior of measured material samples. The proposed model obeys the energy conservation law and can be used in Physically-Based Rendering (PBR) shaders to create realistic and visually pleasing specular highlights. The results of using the proposed model are demonstrated and discussed. The highlight shape created by this model is compared against several existing models as well as empirical data.</p>
      </abstract>
    </article-meta>
  </front>
  <body>
    <sec id="sec-1">
      <title>I. INTRODUCTION</title>
      <p>
        Nowadays there are several models of microsurface normal
distribution available for specular Bidirectional Reflectance
Distribution Function (BRDF) ranging from minimalistic
ones like Blinn-Phong to complex models like
CookTorrance [
        <xref ref-type="bibr" rid="ref1">1</xref>
        ], Trowbridge-Reitz [
        <xref ref-type="bibr" rid="ref2">2</xref>
        ], Backmann [
        <xref ref-type="bibr" rid="ref3">3</xref>
        ], and other
models. However, such models suffer from the same
problem – with low roughness values the tail of the highlight
is not nearly long enough even with the most advanced
models.
      </p>
      <p>The research presented in this paper is aimed at creating a
new model of normal distribution for specular BRDF that
would retain realistically long highlight tail with low
roughness values.</p>
    </sec>
    <sec id="sec-2">
      <title>II. RELATED WORK</title>
      <p>There is a relatively large number of research papers
devoted to solving similar tasks.</p>
      <p>
        Thus, Dupuy et al. proposed in [
        <xref ref-type="bibr" rid="ref4">4</xref>
        ] a reflectance filtering
technique for displacement mapped surfaces called Linear
Efficient Antialiased Displacement and Reflectance mapping.
The authors assert that their method is compatible with
animation and deformation, making it general and flexible.
      </p>
      <p>
        Gartley et al. presented in [
        <xref ref-type="bibr" rid="ref5">5</xref>
        ] the framework for a new
pBRDF prediction tool leveraging the radiometric ray-tracing
framework of the Digital Imaging and Remote Sensing Image
Generation model. The authors state that predictions from the
tool have been verified for clean, randomly rough surfaces
against a generalized, analytical p-BRDF model.
      </p>
      <p>
        In [
        <xref ref-type="bibr" rid="ref6">6</xref>
        ], Heitz and d’Eon proposed an importance sampling
scheme for microfacet-based BSDFs. The authors claim that
the performance of this scheme is suitable for both offline
and GPU rendering.
      </p>
      <p>
        Heitz in [
        <xref ref-type="bibr" rid="ref7">7</xref>
        ] presented the masking-shadowing functions
(geometric attenuation factors) in microfacet-based BRDFs
and provided explanations on their applications.
      </p>
      <p>
        Hanika et al. in [
        <xref ref-type="bibr" rid="ref8">8</xref>
        ] proposed an advancement of microfacet
theory based on the Smith model in order to include
microsurface multiple scattering at rough material interfaces
for reflectance and transmission. The authors compared the
predictions made by their model with results obtained by
simulating multiple scattering on explicit microsurfaces
generated with a noise primitive.
      </p>
      <p>
        Walteret et al. in [
        <xref ref-type="bibr" rid="ref9">9</xref>
        ] provided a review of the microfacet
theory and demonstrated how it can be extended to simulate
transmission through rough surfaces such as etched glass.
      </p>
      <p>
        In [
        <xref ref-type="bibr" rid="ref10">10</xref>
        ], Dupuy et al. introduce the Symmetric GGX
distribution to represent spatially-varying properties of
anisotropic microflake participating media.
      </p>
      <p>Despite of availability of these and other promising results
a need of new models development still exists.</p>
    </sec>
    <sec id="sec-3">
      <title>III. MODEL DESCRIPTION</title>
      <p>The proposed model is based on an assumption that the
surface contains cavities of different depths with deeper
cavities being less probable. In order to calculate the
brightness of a given surface the following steps are
performed:
• Calculation of the depth of a cavity that would reflect
given light direction vector to the direction of given view
vector;
• Calculation of the probability of required cavity.</p>
      <p>The reflection of light vector which hits a cavity is
demonstrated in Fig. 1.</p>
      <p>The height of a cavity which reflects a given light vector
into view vector is calculated using following the formula:
(1)
where h is the height of the cavity and b is the Blinn term.</p>
      <p>The plot of cavity height function in relation to Blinn term
is presented in Fig. 2.</p>
      <p>After calculation of the cavity height, the probability
distribution must be applied. Because Gaussian Distribution
Function does not provide the desired result, the proposed
model uses a custom distribution function:</p>
      <p>The integral of this function over ϕ ∈ (0; π) does converge
and is equal to:
(2)
where f is the distribution coefficient, h is the height of the
cavity, and r is the surface roughness coefficient. This
function is not normalized (does not integrate to 1) and, thus,
should be divided by its integral to be used as a probability
distribution.
a
b
However, the integral of this function over h ∈ (0; ∞) does
not converge. But instead it is possible to integrate the total
amount of reflected light over ϕ ∈ (0; π) where ϕ is the angle
between the cavity normal and the surface normal, thus,
preserving the energy conservation law.</p>
      <p>The dividing of the proposed distribution function by this
integral yields the normalized NDF ready to be used for
modelling specular reflections:
where P (ϕ, r) is the probability of the required cavity, r is the
surface roughness coefficient, and cos(ϕ) is the Blinn term.</p>
      <p>In order to maintain consistency, it is proposed to use the
described NDF with a custom geometric masking function
based on the same microsurface model.</p>
      <p>The proposed geometric masking function describes the
decrease of visible highlight due to microsurface cavity being
obscured from light source and from the viewer by adjacent
microsurface apex as demonstrated in Fig. 3.
(4)
(5)
The masking term is derived by dividing the length of
visible (for view masking) or lit (for light masking) part of
microsurface cavity slope by its total length (Fig. 4).
where f is the distribution coefficient, r is surface roughness,
and ϕ is the angle between the surface normal and the cavity
normal as well as cos(ϕ) is the Blinn term.
(3)
The total microsurface slope length can be described as:
where ltotal is the total microsurface slope length and ϕ is the
angle between the macrosurface normal and the light vector.</p>
      <p>The visible part of the slope is equal to:
where lvisible is the visible part of the microsurface slope, ltotal
is the total microsurface slope length, ϕ is the angle between
the macrosurface normal and the light vector, and β is the
angle between the microsurface slope and the macrosurface.</p>
      <p>Thus, the masking coefficient is equal to:
where m is the masking coefficient, ϕ is the angle between
the macrosurface normal and the light vector, and β is the
angle between the microsurface slope and the macrosurface.</p>
      <p>The masking function can be also presented as follows:
Thus, the final masking coefficient formula is:
(6)
(7)
(8)
(9)
(10)
where m is the masking coefficient, ϕ is the angle between
the macrosurface normal and the light vector, and β is the
angle between the microsurface slope and the macrosurface.</p>
      <p>The total masking coefficient should be calculated as the
lowest value between light masking and view masking:
(11)
where m is the total masking coefficient, γ is the angle
between the macrosurface normal and the view vector, ϕ is
the angle between the macrosurface normal and the light
vector, and β is the angle between the microsurface slope and
the macrosurface.</p>
    </sec>
    <sec id="sec-4">
      <title>IV. RESULTS AND DISCUSSION</title>
      <p>The proposed model creates a long highlight tail which
looks more similar to empiric measurements as demonstrated
in Fig. 5 and Fig. 6.</p>
      <p>In fact, the highlight tail of the proposed model is brighter
than empirical data and, thus, may require further adjustment
to achieve better realism in renders.</p>
      <p>Using proposed model for rendering specular highlights
creates a smoother and more realistic result as shown in</p>
      <p>Fig. 7.</p>
      <p>a b c d
Fig. 5. Demonstration of highlights: a – measured data from chrome sample, b – proposed model, c – Trowbridge-Reitz model, d –</p>
      <p>
        Beckmann model [
        <xref ref-type="bibr" rid="ref3">3</xref>
        ]
      </p>
    </sec>
    <sec id="sec-5">
      <title>V. CONCLUSION</title>
      <p>The proposed model retains a long highlight tail even with
roughness coefficient extremely close to zero yielding more
appealing renders. However, it is also computationally
intensive. Besides, it must be noted that the highlight tail of
the proposed model in fact seems brighter than measured data
and, thus, it may need to be adjusted in order to achieve
better realism.</p>
    </sec>
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