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  <front>
    <journal-meta />
    <article-meta>
      <title-group>
        <article-title>Microprocessor Means for Technical Diagnostics of Complex Systems</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <string-name>Warsaw University of Technology</string-name>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Institute of Automatic Control</string-name>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Robotics</string-name>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Warsaw</string-name>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Poland i.korobiichuk@mchtr.pw.edu.pl</string-name>
        </contrib>
        <aff id="aff0">
          <label>0</label>
          <institution>National Aviation University</institution>
          ,
          <addr-line>Kyiv, 03058</addr-line>
          ,
          <country country="UA">Ukraine</country>
        </aff>
        <aff id="aff1">
          <label>1</label>
          <institution>Sergey Korolyov Zhytomyr Military Institute, Cybersecurity Department of the Research Center</institution>
          ,
          <addr-line>Zhytomyr, 10004</addr-line>
          ,
          <country country="UA">Ukraine</country>
        </aff>
      </contrib-group>
      <pub-date>
        <year>1883</year>
      </pub-date>
      <fpage>0000</fpage>
      <lpage>0002</lpage>
      <kwd-group>
        <kwd>complex technical systems</kwd>
        <kwd>technical diagnostics</kwd>
        <kwd>technical states</kwd>
        <kwd>algorithm</kwd>
        <kwd>management of object maintenance</kwd>
      </kwd-group>
    </article-meta>
  </front>
  <body>
    <sec id="sec-1">
      <title>-</title>
      <p>Providing high reliability of functioning of modern complex technical systems (CTS)
includes a wide range of problems, the solution of which is aimed at the efforts of
many specialists of different profiles in the design, manufacture, testing and operation
of such systems. The issues of technical diagnostics with the subsequent organization
of effective maintenance, the main task of which is to maintain the required level of
reliability of complex systems during operation.</p>
      <p>
        At the same time, it should be borne in mind that the characteristic features of
modern CTS are the high degree of integration of the unit and the nodes, the
developed logistics structure and high saturation of computer technology, the wide
application of integrated circuit technology and multi-layer printed editing [
        <xref ref-type="bibr" rid="ref1">1</xref>
        ]. Therefore,
maintenance of such systems is characterized by great laboriousness and a richness of
control and diagnostic operations, an increase in the nomenclature of the measured
CTS parameters, an increase in the requirements for accuracy, reliability and level of
processing of control results [
        <xref ref-type="bibr" rid="ref2">2</xref>
        ]. Therefore, a special place in the complex of
technological operations for CTS maintenance is concurrently granted to operational control.
Qualitatively new approach in the development and use of operational and
controldiagnostic devices leads to a change in the organizational and technological structure
of operational control and maintenance systems. Application in the control and
diagnostic systems of microprocessor means allows to solve a wide range of problems in
the diagnosis of CTS [
        <xref ref-type="bibr" rid="ref2 ref3 ref4 ref5 ref6">2-6</xref>
        ].
      </p>
      <p>Among these problems an important place is occupied by the issues of technical
diagnostics.</p>
      <p>
        The architecture of constructing modern microprocessor means (MPM) for the
technical diagnosis of CTS is largely determined by the constructive and functional
complexity of the monitored objects. If, for example, for CTS of ordinary complexity,
the automation of workability control is reduced mainly to the allowable evaluation of
individual controlled parameters or their disunited summation, then for complex CTS,
which are characterized by a multitude of such parameters, a peculiar hierarchical
structure and unequal connection of individual aggregates a specific complex
approach to the solution of the task of assessing the level of operability of objects [
        <xref ref-type="bibr" rid="ref3">3</xref>
        ]. In
this case, the problem arises of recognizing the classes of technical conditions of RES,
which are formed on the basis of a generalized set of performance indicators and
controlled parameters. This work is considering the expediency of using multi-level
MPM technical diagnostics for these purposes.
      </p>
      <p>It is known that the main task of autocontrol systems is to identify one of the
conditions in the monitored objects - workable or inoperable (failure, halting or
malfunction). The criterion of efficiency is usually reduced to the description of the external
behavior of the CTS, which is characterized by changes in its characteristics, internal
or external parameters. Taking into account the working conditions of objects, which
are described by the relationships between the monitored parameters, it is possible to
form classes of technical states defining the region of the workable and inoperative
CTS states. Obviously, the corresponding values of the internal and external
parameters of the CTS determine the boundary points of these states. The task of autocontrol
systems is to determine the working conditions that are most relevant to the given
criterion. Direct control of the indicators describing this criterion and the search for
boundary points of workability is hampered by a number of difficulties associated
with the diversity of these indicators, the complexity of the representation and
interrelation of the technical implementation. The development of MPM technical
diagnostics, performed in a hierarchical structure, avoids these difficulties.
2.</p>
    </sec>
    <sec id="sec-2">
      <title>Materials and methods of research.</title>
      <p>During operation, modern CTS can be in the following states: normal working
capacity (S1), described by a complex of nominal values of characteristics and parameters;
anticipatory tolerances for controllable parameters (S2); operational nominal
tolerances for controlled parameters, the excess of which is classified as a fault (S3) or
failure (S4); reserve condition (S5).
To assess the possibility of monitoring these states, we will depict the maintenance
process of CTS in the form of a Markov model, which is a graph of discrete states of
the object (Fig. 1). The transition of CTS from one state to another occurs under the
influence of certain events - failures, malfunctions, regulations, performance of
regulated maintenance, etc. The arrows on the graph indicate possible transitions of the
system from one state to another. For clarity of the presented model, we characterize
the intensity of the transitions noted above the corresponding arrows of the graph:
when performing scheduled maintenance in the standby state (λ15); from standby to
operable condition after elimination of failures or maintenance (λ51); gradual failures,
associated with the acquisition of controlled parameters of the values of anticipatory
tolerances (λ12); when conducting regulating and adjusting works (λ21); sudden
failures (λ14); gradual failures associated with the obtainment of pre-emptive values of
the monitored parameters of the states of malfunction (λ23) or failure (λ24); gradual
failures associated with a succession of malfunctions and failures (λ34).</p>
      <p>Thus, from the state S1, the monitored CTS can be transferred to the state S5
when performing the scheduled maintenance (λ15) or when gradual (λ12 - λ23- λ34) and
sudden (λ14) failures occur. When the REN have reached the S2 state, it is necessary
to perform regulating and adjusting operations in order to transfer the object to the Si
state. If this is not possible, the object goes into the conditions of malfunction (S3) or
failure (S4). In the future, it is advisable to transfer this object to a standby state (λ45)
for restoration work.</p>
    </sec>
    <sec id="sec-3">
      <title>The results of research</title>
      <p>
        In accordance with the methodological recommendations given in [
        <xref ref-type="bibr" rid="ref4 ref5">4, 5</xref>
        ], we will
compose a system of differential equations directly from the given graph (Fig. 1),
describing the Markov model of discrete states of the object:
ddPt1  P1 12  14  15   P221  P331  P441  P551 ;
ddPt2  P112  P2 21  23  24  ;
ddPt3  P223  P3 31  34  ;
dP4  P114  P224  P334  P4 41  45  ;
dt
dP5  P115  P445  P551 .
dt
(1)
      </p>
      <p>Taking into account the use of the limiting probabilities of the investigated CTS
states Pi ( Si ), we transform a system of equations to an algebraic form (1), the
left5
hand side of which is equal to zero. Then  P  1. In the future, given the intensities
1
i1
of the transitions λij, the numerical values of the CTS residence probabilities in Si
states are determined, which to a large extent predetermines the architecture of
constructing the MPM of technical diagnostics.</p>
      <p>It is most expedient to build the technical diagnostics MPM on a distributed
architecture, based on the functional decentralization, i.e., the monitoring and diagnostic
system must be performed in multi-level with a hierarchical structure. In this case, the
control and diagnostic process is subdivided into sub-processes with well-defined
interconnection methods for information transfer.</p>
      <p>
        Figure 2 shows a two-level MPM of technical diagnostics, which consists of two
lower-level subsystems and a coordinating microcomputer. Lower-level sybsystems A
and B should conduct a diagnostic control of measuring parameters with different
combinations of sensors and perform preliminary processing of the received
information. In this case, the admission control of the incoming information determines the
position of the controllable parameter in the field of system operability. Thus, with the
help of lower-level subsystems, it is possible to fixate the moments of the CTS
transition from the state of normal working capacity S1 to the states S2  S5 and to obtain
quantitative information about these states. The tasks of recognition of technical states
and control by measuring parameters are solved by the coordinating upper-level
microcomputer. Taking into account the quantitative characteristics of the Markov
model of CTS states, it is possible to preliminarily describe the problems solved by
both computers and determine the architecture of their construction by defining the
corresponding amount of memory, organizing the interaction of functional systems,
etc. Thus, the RAM memory size of the coordinating microcomputer depends mainly
on the mathematical model and the algorithm for recognizing the technical states of
the Markov model.
The mathematical basis for the recognition of technical states of CTS can be laid by
Bayesian criterion [
        <xref ref-type="bibr" rid="ref6 ref7 ref8">6-8</xref>
        ] or the maximum likelihood principle for equiprobable states
P
i
k 
  K1 x1, x2 ,..., xn 
  K2 x1, x2 ,..., xn 
 1 ,
(2)
Where k is the criterion for recognition (classification) of technical states of CTS;
K1, K2 - the investigated classes of technical states of CTS; x1, x2 ,..., xn - indicators
of technical condition or monitored parameters of the object.
      </p>
      <p>
        For complex CTS, it is advisable to install the following classes of technical states
[
        <xref ref-type="bibr" rid="ref10 ref11 ref12 ref9">9-12</xref>
        ]:
class K1 - a set of CTS status indicators requiring continuous monitoring, the
deviation of which can cause a malfunction or complete failure of the object;
- class K2 - a set of indicators of the state of CTS, requiring periodic
monitoring, the deviation of which can cause partial failures or malfunctions of the
object;
- class K3 - a set of indicators of the state of CTS, which determine the
conduction of regulated maintenance.
      </p>
      <p>In the general case, the number of classes considered exceeds the number given in
the Markov model (Fig. 1).
The scheme of the algorithm of operation of the subsystem of the lower-level MPM is
shown in Fig. 3. The presented algorithm solves the problem of estimating the
monitored parameter for finding it in the field of operability. The values of the monitored
parameter are compared with the values of its admissible values, which are stored in
the memory of the microcomputer (procedure 1). In addition, a ping sequence of
sensors installed in the CTS and an algorithm for calculating the parameters determined
by indirect methods are also stored in memory.</p>
      <p>Procedure 2 is organizing a cycle of MPM selecting the technical diagnostics of
the corresponding controlled parameter. If the MPM is not correctly connected, the
system is dynamically stopped by the processor (procedure 13) and the command is
repeated to connect the desired sensor to the monitoring system (procedure 12).
Simultaneously, for a high-level microcomputer, a signal is generated about the absence
of such a connection at a given time (procedure 14). When connecting the
corresponding object sensor to the MPM in the microcomputer from the measuring part
(Fig. 2), information is received on the value of the parameter controlled at a given
time (procedure 3). Correspondence of the CTS parameters of the working capacity
field can be carried out with the help of the admission control according to the
precompiled algorithm stored in the micro-computer memory (procedure 4). When the
monitored parameter exits the boundaries of the working capacity field, the
lowerlevel system is dynamically stopped (procedure 11) and a message "out of tolerance"
is generated for the upper-level computer (procedure 15). Then the upper-level
computer is assuming direct control of the process of measuring and recognizing the
technical state of the object. If the complex evaluation shows that the output of one
parameter outside of the working capacity field does not affect the overall performance
of the CTS, then the control of the process of measuring parameters and analyzing the
state of the object is transferred again to the lower-level computer. The values of the
CTS parameters that have passed the admission control are entered in the RAM of the
lower-level micro-computer (procedure 5). Further, it is checked whether all the
parameters are monitored (procedure 6). If the answer is negative, the system stops
dynamically (procedure 13) and procedures 2-6, 12 are repeated. With full control of
CTS, a conclusion is made about the state of the object (procedure 7). The result of
this evaluation is stored in the computer's RAM instead of the information recorded
during the procedure 5 (procedure 8). In the future, this information can be used for
digital indication (procedure 9) or registration on a digital printer and output to a
upper-level computer (procedure 10).</p>
      <p>Fig. 4. The algorithm of operation of the lower-level subsystem, the upper-level
computer interacts directly with the subsystem
As can be seen from the algorithm of operation of the lower-level subsystem, the
upper-level computer interacts directly with the subsystem. This interaction clearly
illustrates the algorithm of the coordinating microcomputer (Fig. 4). The described
algorithm, in addition to the described functions for coordinating the operation of the
entire technical diagnostic system, determines the collection of information from
lowerlevel subsystems (A and B), by processing which the CTS technical condition is
recognized.</p>
      <p>The coordinating microcomputer performs a sequential ping of lower-level
subsystems A (procedure 1) and B (procedure 2) for the presence of requests (procedure
15 in Fig. 3). If there are no requests, the computer reads the CTS status information
(procedure 3) and processes it (procedure 4). If there is such a request, the computer
switches to procedure 3 (reading data from the information buses of lower-level
subsystems A and B) and the technical condition of CTS is recognized by formula (2)
(procedure 4). On the basis of the received data, a decision is taken on whether the
object is in operable or faulty state (procedure 5). If the technical condition of the
CTS does not meet the specified requirements or the controlled parameters approach
the permissible values, procedures 3-6 are repeated. If the technical condition of the
object is classified as inoperative (procedure 6), the coordinating computer goes to the
malfunction search routine (procedure 7), after which the faulty CTS unit is indicated
(procedure 8). If the departure of parameters beyond the tolerance limits does not
affect the overall operability of the object or all of its parameters are normal, the
information on the current state of the REN is updated on the indicator board (procedure 9)
and MPM proceeds to re-execute all the I procedures.</p>
    </sec>
    <sec id="sec-4">
      <title>Conclusions</title>
      <p>The construction of algorithms for assessing the operability and the recognition of
technical states of CTS can be carried out by preliminary modeling of these problems
on large computers.</p>
      <p>Functional versatility, programmability, a large degree of integration, high
reliability, uncomplicated modification of the performed functions and the low cost of
microprocessor means determine the possibility of their wide application in the
systems of technical diagnostics and management of object maintenance.</p>
    </sec>
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</article>