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  <front>
    <journal-meta />
    <article-meta>
      <title-group>
        <article-title>Comparison of knowledge based feature vector extraction and geometrical parameters of Photovoltaic I-V Curves</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <string-name>C. Basoglu</string-name>
          <email>cbasoglu@fh-bielefeld.de</email>
          <xref ref-type="aff" rid="aff0">0</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>G. Behrens</string-name>
          <xref ref-type="aff" rid="aff0">0</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>K. Mertens</string-name>
          <xref ref-type="aff" rid="aff1">1</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>M. Diehl</string-name>
          <xref ref-type="aff" rid="aff2">2</xref>
        </contrib>
        <aff id="aff0">
          <label>0</label>
          <institution>Fachhochschule Bielefeld, Solar Computing Lab, Artilleriestra e 9</institution>
          ,
          <addr-line>32427 Minden</addr-line>
          ,
          <country country="DE">Germany</country>
        </aff>
        <aff id="aff1">
          <label>1</label>
          <institution>Fachhochschule Munster, Fachbereich Elektrotechnik und Informatik</institution>
          ,
          <addr-line>Photovoltaik-Pru abor, Steinfurt</addr-line>
        </aff>
        <aff id="aff2">
          <label>2</label>
          <institution>photovoltaikbuero, Ternus und Diehl GbR</institution>
          ,
          <addr-line>Russelsheim</addr-line>
        </aff>
      </contrib-group>
      <abstract>
        <p>Current methods for evaluating the performance of PV modules and systems in the eld are exposed to weather conditions during system evaluation. The experimental measurement of performance naturally requires a corresponding amount of solar radiation, which is not available at all times of the year. The aim of this work is the development of a method for the weather-independent PV plant evaluation using the so-called dark I-V curve and an arti cial neural network (ANN). The dark I-V curve can be measured at any time of the year and in any weather condition. In combination with the performance measurements from conventional methods an extensive database is already available, which was used as the ground truth for the development of the proposed model. The results show that with the proposed method a prediction of the power output for illumination levels above 800W=m2 a maximum prediction error below 10% is achieved. Thus, the dark I-V curve can be used for a weather-independent evaluation of PV systems in order to show rst indications of performance losses and further analysis.</p>
      </abstract>
      <kwd-group>
        <kwd>Machine Learning</kwd>
        <kwd>Arti cial Neural Network</kwd>
        <kwd>I-V Curve</kwd>
      </kwd-group>
    </article-meta>
  </front>
  <body>
    <sec id="sec-1">
      <title>-</title>
      <p>
        The in- eld evaluation and fault diagnosis is crucial for a high-yield operation of
photovoltaic plants. Analyzing the light I-V curve (current-voltage curve) of a
PV array is the commonly used method for in- eld evaluation and
characterisation [
        <xref ref-type="bibr" rid="ref2 ref3 ref4 ref5 ref9">2,3,4,5,9,12</xref>
        ]. The I-V curve (see Figure 1) describes the energy conversion
capacity under given conditions of irradiation and temperature. Only the
experimental measurement of the I-V curve is able to specify with precision the
electrical parameters of a photovoltaic cell, module or array.
      </p>
      <p>12</p>
      <p>ISC
(VMPP, PMPP)
(VMPP, IMPP)</p>
      <p>I-V
Power
5
4
1
0
3 )(P
r
e
2 ow</p>
      <p>P
0
100
200
300 400
Voltage (V)
500
600</p>
      <p>The I-V curve starts at the short-circuit condition, ISC , where the voltage is
zero. The current decreases slightly as the voltage is increased, until the curve
nears the open-circuit condition where the current rapidly drops o . The curve
ends at the open-circuit condition, VOC , with the current at zero. At some point
on the I-V curve, the power of the cell is at its maximum. This point is known
as the maximum power point (MPP), and solar cells are the most e cient at
converting light energy into electrical energy at this point.</p>
      <p>
        The in- eld experimental measurement of the I-V curve is highly dependent
on the weather conditions during the evaluation of the system. Passing clouds or
shadows from other objects at certain times of the day result in a not negligible
loss of time. Furthermore, the measurement requires su cient light irradiation
which is not available in all seasons of the year. To address these issues, this
study proposes a novel method by predicting the light I-V curve using the so
called dark I-V curve and an ANN. The dark I-V curve is measured without
illumination by using an external power supply as reverse current source and
is commonly used in the manufacturing process of solar modules [
        <xref ref-type="bibr" rid="ref1 ref6 ref8">1,6,8</xref>
        ]. Thus
makes the dark I-V curve independent of weather conditions while maintaining
many of the previously described electric characteristics.
2
      </p>
    </sec>
    <sec id="sec-2">
      <title>Related Work</title>
      <p>There are already several approaches which can identify faults using dark I-V
curves for diagnostic purposes. For example, the method proposed by Mertens,
K. et al. [10] is able to detect potential induced degradation (PID) and diode
errors using numerical analysis of the dark I-V curve.</p>
      <p>
        Besides the diagnostic value of the dark I-V curves, there are only a few
methods which focus on predicting the light conversion performance under di erent
illumination levels. King et al. [
        <xref ref-type="bibr" rid="ref8">8</xref>
        ] uses the two diode model (see Equation 1)
with some experience based parameter assumptions to extract the remaining
parameters of the model. Mertens et al. [11] uses also the two diode model and
module parameters from the manufacturer data-sheet to solve remaining
parameters of the model. Both methods extract the two diode model parameters using
the dark I-V curve and use these parameters to calculate the light I-V curve.
In this work, one approach also use the two diode model to extract the model
parameters of both, the dark and light I-V curve, and uses this knowledge to
learn the relationship between them.
3
      </p>
    </sec>
    <sec id="sec-3">
      <title>Method</title>
      <p>In cooperation with our research partners, a database with 3424 light and 1656
dark I-V curves from eld and laboratory measurements of 131 di erent module
types has been collected. Each I-V curve consists of 200 current-voltage pairs and
additional metadata like irradiance level and temperature. To build the ground
truth for the proposed method, the dark I-V curves of each module type are
combined with all light I-V curves of the same module type, which results in
37686 training and validation data sets for the neural network. Three di erent
feature extraction approaches for the I-V curve are considered. Each approach
generates a feature set of the dark and light I-V curve. The feature set of the
dark I-V curve is used as the input vector and the light I-V curve as the output
vector for the neural network.</p>
      <p>
        The rst approach (E1) uses the the electrical two diode model [
        <xref ref-type="bibr" rid="ref7">7</xref>
        ] and
performs the levenberg-marquardt curve tting algorithm to t the following
function to the measured data points.
      </p>
      <p>I = IP H</p>
      <p>U+I RS
IS1 (e 1 UT</p>
      <p>U+I RS
1) IS2 (e 2 UT
1)</p>
      <p>U + I RS</p>
      <p>RP
(1)
The extracted series resistance (RS), parallel shunt resistance (RP ), saturation
currents (IS1;2 ), diode ideality factors ( 1;2) and temperature coe cient (UT )
of the dark and light I-V curves, are used as an input and respectively output
vector for the neural network.</p>
      <p>The second approach (E2) for feature extraction performs a principal
component analysis of the I-V curves while retaining 95% of its variance. This approach
generates 64 components for the dark I-V curve and 76 components for the light
I-V curve.</p>
      <p>The last approach (E3) uses a barycentric lagrange interpolation to extract
20 equidistant points for each I-V curve. Since the points are equidistant, the
values on the x-axis (voltage) are removed and only implied by its position in
the vector.</p>
      <p>The architecture of the neural network for all approaches consists of the
input, output and a single hidden layer. The number of nodes in the hidden
layer equals half the average of the input and output layers. The output of the
nodes in the hidden layer are controlled by the tangens hyperbolicus (tanh)
activation function and the network is optimized using the RMSE error function
with RMSprop optimization algorithm. Finally the dense networks are trained
with 75% of the combined data sets, using 80% of it for the training and 20%
for the optimizer validation to avoid over tting.
For the nal validation of the di erent approaches, 25% of the combined data
sets are used. Table 1 shows the mean percentage error (MPE) using min/max
and percentiles for the error distribution. For this purpose the light I-V curves
are reconstructed from the features described and compared to the measured I-V
curves. Overall, the third approach (E3) using the equidistant interpolation of
Mean</p>
      <p>SD ( )</p>
      <p>Min.</p>
      <p>25%
50%
75%</p>
      <p>Max.
the I-V curve yields the smallest prediction error. Figure 2 shows the predicted
I-V curve (green) and the measured I-V curve (dashed black) for the third
approach (E3). With some exceptions, the prediction becomes more accurate with
0 0
950 W/m² 36 °C
740 W/m² 37 °C
575 W/m² 37 °C
0 5 10 15 Voltage (U) 25 30 35 40</p>
      <p>20
980 W/m² 44 °C
875 W/m² 44 °C
765 W/m² 22 °C
600 W/m² 40 °C
394 W/m² 36 °C
218 W/m² 30 °C
43 W/m² 26 °C
100 200 Volt3a0g0e (U) 400 500</p>
      <p>Mesasunreg
E3
Mesasunreg
E3
6
I)(trrenuC43251 986321246670549 WWWWW/////mmmmm²²²²² 2442245264 °°°°°CCCCC
0 0 3120W0/m² 1420°0C Vo3l0ta0ge (U)400 500 600</p>
      <p>Measure</p>
      <p>E3
8
I)(trr46
n
e
u
C
2
0
868 W/m² 46 °C
746 W/m² 47 °C</p>
      <p>Measure</p>
      <p>E3
0 100 200 300Voltage (U) 500 600 700 800
400
(a) Solon P165/5</p>
      <p>(b) Sunpower E19 240 (14 in series)
(c) Kyocera KC180 (20 in series) (d) Winaico WST-250P6 (22 in
series)
increasing irradiation. Above 800 W=m2 the maximum prediction error is
below 10%, which is in the range of peak performance prediction of commercially
available light I-V curve measurement devices [13].</p>
    </sec>
    <sec id="sec-4">
      <title>Conclusion and Future Work</title>
      <p>In summary we tested di erent pre-processing approaches in order to predict the
light I-V curve using the dark I-V curve and an ANN. The experimental results
shows that using interpolated points of the I-V curve yields better results than
using a PCA or the electrical two diode model for feature extraction. We plan to
further investigate recurrent neural networks with an increased number of I-V
curve points to further improve the prediction accuracy.</p>
    </sec>
    <sec id="sec-5">
      <title>Acknowledgements</title>
      <p>This work has been developed in the project PVServ 2.0 (reference number:
ZF4401205LT7) and is funded by the German ministry of economic and energy
(BMWi) within the research programme ZIM 2018.
10. Mertens, K., Arnds, A., Diehl, M.: Quick and e ective plant
evaluation using dark-iv string curves. In: Proceedings of 33st European
Photovoltaic Solar Energy Conference, Amsterdam, 2017. pp. 2346 { 2348 (2017).
https://doi.org/10.4229/EUPVSEC201
11. Mertens, K.: String-dunkelkennlinien: Eine neue e ziente methode zur
anlagenevaluation, 33. symposium photovoltaische solarenergie, sta elstein, 27.04.2018
(2019)
12. Sarikh, S., Raou , M., Bennouna, A., Benlarabi, A., Ikken, B.: Fault diagnosis in a
photovoltaic system through iv characteristics analysis. In: 2018 9th International
Renewable Energy Congress (IREC). pp. 1{6. IEEE (2018)
13. Wagner, A.: Photovoltaik Engineering. Springer (2006)</p>
    </sec>
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