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<div xmlns="http://www.tei-c.org/ns/1.0"><p>SemIIM2023 was a full-day workshop that took place on 7th November 2023 in Athens, Greece, colocated with the 22nd edition of the International Semantic Web Conference (ISWC2023). This workshop invited industrial as well as academic keynotes and papers, covering the challenges and solutions for addressing industrial information modelling, including methods and practices of representing concepts, relationships, constraints, rules and operations to specify data semantics for a chosen domain of interest. The workshop gathered the interested community and discussed the latest approaches for challenges both from the perspectives of academia and industry.</p></div>
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<div xmlns="http://www.tei-c.org/ns/1.0"><head n="1.">Introduction</head><p>Information Modelling (IM) has been under the spotlight of both academia and industry for decades <ref type="bibr" target="#b0">[1,</ref><ref type="bibr" target="#b1">2]</ref>. Important aspects of IM include methods and practices of representing concepts, relationships, constraints, rules and operations to specify data semantics for a chosen domain of interest. As a response to the IM challenge a number of modelling paradigms and languages arose and they range from ERM <ref type="bibr" target="#b2">[3]</ref>, UML <ref type="bibr" target="#b3">[4]</ref>, ORM <ref type="bibr" target="#b4">[5]</ref> to OWL <ref type="bibr" target="#b5">[6]</ref> and Knowledge Graphs <ref type="bibr" target="#b6">[7]</ref> and come with a wide range of systems to support the life cycle of information models <ref type="bibr" target="#b7">[8,</ref><ref type="bibr" target="#b8">9]</ref>.</p><p>Despite the past success, existing approaches and systems for IM fail to cope with new challenges of overwhelming global industrial digitalization that requires advanced information models and aims at fully computerized, software-driven, automation of production processes and enterprise-wide integration of software components <ref type="bibr" target="#b9">[10,</ref><ref type="bibr" target="#b10">11,</ref><ref type="bibr" target="#b11">12,</ref><ref type="bibr" target="#b12">13,</ref><ref type="bibr" target="#b13">14]</ref>. Such trend and the technological and industrial developments that come with it are an important part of Industry 4.0 and industrial Internet of Things <ref type="bibr" target="#b14">[15]</ref>. It requires IM that, for example, allows to capture the functionality of and information flow between different assets in a plant, such as equipment and production processes. Moreover, it requires IM and models that are based on ISA and IEC standards and have a number of desirable properties, e.g., reusable, explainable, scalable, simulatable etc <ref type="bibr" target="#b15">[16,</ref><ref type="bibr" target="#b16">17]</ref>. Such IM should allow for seamless data sharing and integration e.g., via data market places and across value chains <ref type="bibr" target="#b17">[18,</ref><ref type="bibr" target="#b18">19]</ref>. These new challenges require new theory, methodology, best practice, systems and this should be developed, shared, and discussed by a wire range of stakeholders. Therefore, we initiated the 1st International Workshop on Semantic Industrial Information Modelling (SemIIM) to provide a venue for the community of industrial information modelling. This is the second edition of the workshop. The first edition <ref type="bibr" target="#b19">[20]</ref> was held on 30th May 2022, in Hersonissos, Crete, Greece.</p></div>
<div xmlns="http://www.tei-c.org/ns/1.0"><head n="2.">The SemIIM2023 Workshop</head><p>The 2nd International Workshop on Semantic Industrial Information Modelling (SemIIM) aims at gathering researchers and practitioners who work on addressing these challenges with the help of semantic technologies. We in particular invited IM experts who are excited and committed to push the frontiers of IM further and support modern industry in its current technological transformation. In our workshop we welcomed novel methods, systems, solutions, experience, and practice for semantic industrial information modelling.</p><p>The workshop included the sessions described in the following sections.</p></div>
<div xmlns="http://www.tei-c.org/ns/1.0"><head n="2.1.">Academic Keynote</head><p>The Academic Keynote was given by Oscar Corcho at Universidad Politécnica de Madrid (Spain) on the topic: "On the Governance of all the Artefacts used in Knowledge Graph Creation and Maintenance Scenarios". Abstract: The creation and maintenance of knowledge graphs is commonly based on the generation and use of several types of artefacts, including ontologies, declarative mappings and different types of scripts and data processing pipelines, sample queries, APIs, etc. All of these artefacts need to be properly maintained so that knowledge graph creation and maintenance processes are sustainable over time, especially in those cases where the original data sources change frequently. It is not uncommon to have situations where ontologies are governed by an organisation or group of organisations, while mappings and data processing pipelines are handled by other organisations or individuals, using different sets of principles. This causes mismatches in the knowledge graphs that are generated, including the need to update all the associated artefacts (declarative mappings, sample queries, APIs, etc.) so as to keep up to date to changes in the ontologies, or in the underlying data sources. In this talk we will discuss several of the challenges associated to the maintenance of all of these artefacts in real-world knowledge graph scenarios, so as to provide some light into how we could set up a complete knowledge graph governance model that may be used across projects and initiatives.</p></div>
<div xmlns="http://www.tei-c.org/ns/1.0"><head n="2.2.">Industrial Keynote</head><p>The Industrial Keynote was given by Sten Grüner at ABB Corporate Research (Germany) on the topic "Asset Administration Shell -Industry 4.0 in theory and practice".</p><p>Abstract: Industry 4.0 is a more than 10-year-old vision of digitalised, adaptive and resilient industry based on converged IT/OT technologies breaching the gap between engineering and computer science. Over the year an understanding of gaps between different information domains across product and equipment lifecycle and supply chain emerged. Asset Administration Shell (AAS) concept was created to close this gap by implementing Digital Twin concepts for industrial applications. In this talk, I will give a brief introduction into AAS information model, implementations and present some selected pilots and demonstrators making use of this technology.</p></div>
<div xmlns="http://www.tei-c.org/ns/1.0"><head n="2.3.">Workshop Papers</head><p>Eleven papers were submitted and accepted. The reviews were hosted at EasyChair. Each paper received at least three reviews from reviewers with different background and status. The following papers were accepted for publication and presented at the workshop:</p><p>• Automating Building Regulations Conformance Checking Using a Semantic Approach -Preliminary Results <ref type="bibr" target="#b20">[21]</ref> • Semantic Association Rule Learning from Time Series Data and Knowledge Graphs <ref type="bibr" target="#b21">[22]</ref> • Extending PLASMA for Industrial Semantic Modeling <ref type="bibr" target="#b22">[23]</ref> • GraphGuard: Enhancing Data Quality in Knowledge Graph Pipelines <ref type="bibr" target="#b23">[24]</ref> • The Design of the Diagrammatic and Semantic Models for Process Modelling Language for Digital Triplet <ref type="bibr" target="#b24">[25</ref> </p></div><figure xmlns="http://www.tei-c.org/ns/1.0" xml:id="fig_0"><head>SemIIM' 23 :</head><label>23</label><figDesc>2nd International Workshop on Semantic Industrial Information Modelling, 7th November 2023, Athens, Greece, co-located with 22nd International Semantic Web Conference (ISWC 2023)arild@ifi.uio.no (A. Waaler); baifan.zhou@oslomet.no (B. Zhou)</figDesc></figure>
<figure xmlns="http://www.tei-c.org/ns/1.0" type="table" xml:id="tab_0"><head></head><label></label><figDesc>] • SHM: A Light-weight, Mid-level Ontology for Reliable System Health Monitoring [26] • Multi-Architecture Unified Modeling for Manufacturing Service Value Net System De-Evgeny Kharlamov, Bosch Center for AI / University of Oslo, Germany • Dimitrios Kyritsis, University of Oslo / EPFL, Norway • Dumitru Roman, SINTEF AS, Norway • Ognjen Savkovic, Free University of Bozen-Bolzano, Italy • Ahmet Soylu, Oslo Metropolitan University, Norway • Steffen Staab, University of Stuttgart, Germany • Arild Waaler, University of Oslo, Norway • Baifan Zhou, Oslo Metropolitan University / University of Oslo, Norway</figDesc><table><row><cell>sign [27]</cell></row><row><cell>• Term Frequency Analysis for Semantic Modeling of Geological Fault Knowledge in the</cell></row><row><cell>Energy Industry [28]</cell></row><row><cell>• Towards a Knowledge Graph-based Data Mesh for Smart Manufacturing [29]</cell></row><row><cell>• Towards Semantic Modeling of Camera from Image Quality Testing Perspective: Valeo</cell></row><row><cell>Vision Systems Case [30]</cell></row><row><cell>• Towards Standardised Product Data Exchange with Information Modelling Framework at</cell></row><row><cell>Siemens Energy [31]</cell></row><row><cell>3. Organising Committee</cell></row></table><note>•</note></figure>
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<div xmlns="http://www.tei-c.org/ns/1.0"><head>Acknowledgements</head><p>This workshop is supported by the SIRIUS Centre, Norwegian Research Council project number 237898, and the European Commission H2020 projects Dome 4.0 (953163), OntoCommons (958371), enRichMyData (101070284), and DataCloud (101016835).</p></div>
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<div xmlns="http://www.tei-c.org/ns/1.0"><head n="4.">Program Committee</head><p>• Jieying Chen, University of Oxford, United Kingdom • Zhuo Chen, Zhejiang University, China • Gong Cheng, Nanjing University, China • Gordian Dziwis, Institut für Angewandte Informatik, Germany • Christian Glomb, Siemens AG, Germany • Irlan Grangel-Gonzalez, Bosch Corporate Research, Germany • Joerg Haehner, University of Augsburg, Germany • Michael Heider, University of Augsburg, Germany • Alwin Hoffmann, XITASO GmbH, Germany • Anton Hummel, XITASO GmbH, Germany • Eduard Kamburjan, of Oslo, Norway • Evgeny Kharlamov, Bosch Center for AI / University of Oslo, Germany • Dimitrios Kyritsis, University of Oslo / EPFL, Norway • Qianhang Lyu, University of Oslo / Huazhong University of Science and Technology, Norway • Francisco Martin-Recuerda, SINTEF AS, Norway • Lars-Peter Meyer, Institut für Angewandte Informatik, Germany • Maja Milicic Brandt, Siemens AG, Germany • Richard Nordsieck, XITASO GmbH, Germany • Yuanwei Qu, University of Oslo, Norway • Dumitru Roman, SINTEF AS, Germany • Ognjen Savkovic, Free University of Bozen-Bolzano, Italy • Ahmet Soylu, Oslo Metropolitan University, Norway • Steffen Staab, University of Stuttgart, Germany • Arild Waaler, University of Oslo, Norway • Dirk Walther, DNV, Norway • Muhammad Yahya, National University of Ireland Galway, Ireland • Zhuoxun Zheng, Bosch Center for AI, Germany • Baifan Zhou, Oslo Metropolitan University / University of Oslo, Norway</p></div>
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