<?xml version="1.0" encoding="UTF-8"?>
<TEI xml:space="preserve" xmlns="http://www.tei-c.org/ns/1.0" 
xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" 
xsi:schemaLocation="http://www.tei-c.org/ns/1.0 https://raw.githubusercontent.com/kermitt2/grobid/master/grobid-home/schemas/xsd/Grobid.xsd"
 xmlns:xlink="http://www.w3.org/1999/xlink">
	<teiHeader xml:lang="en">
		<fileDesc>
			<titleStmt>
				<title level="a" type="main">Causal Neuro-Symbolic AI for Root Cause Analysis in Smart Manufacturing</title>
			</titleStmt>
			<publicationStmt>
				<publisher/>
				<availability status="unknown"><licence/></availability>
			</publicationStmt>
			<sourceDesc>
				<biblStruct>
					<analytic>
						<author>
							<persName><forename type="first">Utkarshani</forename><surname>Jaimini</surname></persName>
							<email>ujaimini@email.sc.edu</email>
							<affiliation key="aff0">
								<orgName type="department">Artificial Intelligence Institute</orgName>
								<orgName type="institution">University of South Carolina</orgName>
								<address>
									<settlement>Columbia</settlement>
									<region>SC</region>
									<country key="US">USA</country>
								</address>
							</affiliation>
						</author>
						<author>
							<persName><forename type="first">Cory</forename><surname>Henson</surname></persName>
							<email>cory.henson@us.bosch.com</email>
							<affiliation key="aff1">
								<orgName type="department">Bosch Center for Artificial Intelligence</orgName>
								<address>
									<settlement>Pittsburgh</settlement>
									<region>PA</region>
									<country key="US">USA</country>
								</address>
							</affiliation>
						</author>
						<author>
							<persName><forename type="first">Amit</forename><surname>Sheth</surname></persName>
							<affiliation key="aff0">
								<orgName type="department">Artificial Intelligence Institute</orgName>
								<orgName type="institution">University of South Carolina</orgName>
								<address>
									<settlement>Columbia</settlement>
									<region>SC</region>
									<country key="US">USA</country>
								</address>
							</affiliation>
						</author>
						<author>
							<persName><forename type="first">Ramy</forename><surname>Harik</surname></persName>
							<email>harik@mailbox.sc.edu</email>
							<affiliation key="aff2">
								<orgName type="department">McNAIR Aerospace Center</orgName>
								<orgName type="institution">University of South Carolina</orgName>
								<address>
									<settlement>Columbia</settlement>
									<region>SC</region>
									<country key="US">USA</country>
								</address>
							</affiliation>
						</author>
						<title level="a" type="main">Causal Neuro-Symbolic AI for Root Cause Analysis in Smart Manufacturing</title>
					</analytic>
					<monogr>
						<idno type="ISSN">1613-0073</idno>
					</monogr>
					<idno type="MD5">BA1A744BAB6094AAD694B567D650458F</idno>
				</biblStruct>
			</sourceDesc>
		</fileDesc>
		<encodingDesc>
			<appInfo>
				<application version="0.7.2" ident="GROBID" when="2025-04-23T16:48+0000">
					<desc>GROBID - A machine learning software for extracting information from scholarly documents</desc>
					<ref target="https://github.com/kermitt2/grobid"/>
				</application>
			</appInfo>
		</encodingDesc>
		<profileDesc>
			<textClass>
				<keywords>
					<term>Causality</term>
					<term>neuro-symbolic AI</term>
					<term>root cause analysis</term>
					<term>smart manufacturing</term>
				</keywords>
			</textClass>
			<abstract>
<div xmlns="http://www.tei-c.org/ns/1.0"><p>Root cause analysis is the process of investigating the cause of a failure and providing measures to prevent future failures. It is an active area of research due to the complexities in manufacturing production lines and the vast amount of data that requires manual inspection. We present a combined approach of causal neuro-symbolic AI for root cause analysis to identify failures in smart manufacturing production lines. We have used data from an industry-grade rocket assembly line and a simulation package to demonstrate the effectiveness and relevance of our approach.</p></div>
			</abstract>
		</profileDesc>
	</teiHeader>
	<text xml:lang="en">
		<body>
<div xmlns="http://www.tei-c.org/ns/1.0"><head n="1.">Root Cause Analysis in Smart Manufacturing</head><p>Smart Manufacturing, or Industry 4.0, represents a wave of innovations and new technologies that are shaping the future of manufacturing with the goal of achieving more efficient production lines. Advanced sensors and Internet of Things devices collect data about various aspects of the production process, marking the onset of data-driven manufacturing. The collected data is utilized for predictive maintenance, process optimization, and root cause analysis (RCA). Traditional RCA is a costly and time-consuming process that involves manual inspection by domain experts, potentially leading to production delays. The automation of RCA is an active research area in smart manufacturing, aimed at minimizing downtime and ensuring costeffective production lines. Current work on RCA leverages ontologies, knowledge graphs (KG), and neuro-symbolic methods to store expert knowledge, model production line dependencies, and conduct reasoning to identify the time, location, and cause of failures <ref type="bibr" target="#b0">[1]</ref>. In order to better understand and explain the root cause of failures and provide preventive measures, it is important to comprehend and model the causal associations in the data. However, parametric causal AI approaches for RCA do not consider prior knowledge about the relationships and parameters in the data <ref type="bibr" target="#b1">[2]</ref>. Furthermore, traditional causal association approaches, which predict causal relations between variables, do not scale well for large volumes of data <ref type="bibr" target="#b2">[3]</ref>. Effective</p></div>		</body>
		<back>
			<div type="references">

				<listBibl>

<biblStruct xml:id="b0">
	<monogr>
		<title level="m" type="main">Root cause analysis for manufacturing using semantic web technologies</title>
		<author>
			<persName><forename type="first">T</forename><surname>Strobel</surname></persName>
		</author>
		<imprint>
			<date type="published" when="2023">2023</date>
		</imprint>
	</monogr>
</biblStruct>

<biblStruct xml:id="b1">
	<analytic>
		<title level="a" type="main">Causal structure-based root cause analysis of outliers</title>
		<author>
			<persName><forename type="first">K</forename><surname>Budhathoki</surname></persName>
		</author>
		<author>
			<persName><forename type="first">L</forename><surname>Minorics</surname></persName>
		</author>
		<author>
			<persName><forename type="first">P</forename><surname>Blöbaum</surname></persName>
		</author>
		<author>
			<persName><forename type="first">D</forename><surname>Janzing</surname></persName>
		</author>
	</analytic>
	<monogr>
		<title level="m">International Conference on Machine Learning</title>
				<meeting><address><addrLine>PMLR</addrLine></address></meeting>
		<imprint>
			<date type="published" when="2022">2022</date>
		</imprint>
	</monogr>
</biblStruct>

<biblStruct xml:id="b2">
	<analytic>
		<title level="a" type="main">Review of causal discovery methods based on graphical models</title>
		<author>
			<persName><forename type="first">C</forename><surname>Glymour</surname></persName>
		</author>
		<author>
			<persName><forename type="first">K</forename><surname>Zhang</surname></persName>
		</author>
		<author>
			<persName><forename type="first">P</forename><surname>Spirtes</surname></persName>
		</author>
	</analytic>
	<monogr>
		<title level="j">Frontiers in genetics</title>
		<imprint>
			<biblScope unit="volume">10</biblScope>
			<biblScope unit="page">524</biblScope>
			<date type="published" when="2019">2019</date>
		</imprint>
	</monogr>
</biblStruct>

<biblStruct xml:id="b3">
	<analytic>
		<title level="a" type="main">Causal neuro-symbolic ai: A synergy between causality and neuro-symbolic methods</title>
		<author>
			<persName><forename type="first">U</forename><surname>Jaimini</surname></persName>
		</author>
		<author>
			<persName><forename type="first">C</forename><surname>Henson</surname></persName>
		</author>
		<author>
			<persName><forename type="first">A</forename><surname>Sheth</surname></persName>
		</author>
	</analytic>
	<monogr>
		<title level="j">IEEE Intelligent Systems</title>
		<imprint>
			<biblScope unit="volume">39</biblScope>
			<date type="published" when="2024">2024</date>
		</imprint>
	</monogr>
</biblStruct>

<biblStruct xml:id="b4">
	<monogr>
		<author>
			<persName><forename type="first">R</forename><surname>Harik</surname></persName>
		</author>
		<author>
			<persName><forename type="first">F</forename><surname>Kalach</surname></persName>
		</author>
		<idno type="arXiv">arXiv:2401.15544</idno>
		<title level="m">Analog and multi-modal manufacturing datasets acquired on the future factories platform</title>
				<imprint>
			<date type="published" when="2024">2024</date>
		</imprint>
	</monogr>
	<note type="report_type">arXiv preprint</note>
</biblStruct>

				</listBibl>
			</div>
		</back>
	</text>
</TEI>
