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  <front>
    <journal-meta>
      <issn pub-type="ppub">1613-0073</issn>
    </journal-meta>
    <article-meta>
      <title-group>
        <article-title>Knowledge Representation and Engineering for Smart Diagnosis of Cyber Physical Systems</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <string-name>Ameneh Naghdi Pour</string-name>
          <email>a.naghdipour@vu.nl</email>
          <xref ref-type="aff" rid="aff2">2</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Benno Kruit</string-name>
          <email>b.b.kruit@vu.nl</email>
          <xref ref-type="aff" rid="aff2">2</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Jieying Chen</string-name>
          <email>j.y.chen@vu.nl</email>
          <xref ref-type="aff" rid="aff2">2</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Godfried Webers</string-name>
          <email>godfried.webers@philips.com</email>
          <xref ref-type="aff" rid="aff1">1</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Peter Kruizinga</string-name>
          <email>peter.kruizinga@cpp.canon</email>
          <xref ref-type="aff" rid="aff0">0</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Stefan Schlobach</string-name>
          <email>k.s.schlobach@vu.nl</email>
          <xref ref-type="aff" rid="aff2">2</xref>
        </contrib>
        <contrib contrib-type="author">
          <string-name>Workshop</string-name>
        </contrib>
        <aff id="aff0">
          <label>0</label>
          <institution>Canon Production Printing Netherlands</institution>
          ,
          <addr-line>Van der Grintenstraat 1, 5914 HH Venlo, NL</addr-line>
        </aff>
        <aff id="aff1">
          <label>1</label>
          <institution>Philips Medical Systems International</institution>
          ,
          <addr-line>Veenpluis 6, 5684 PC Best, NL</addr-line>
        </aff>
        <aff id="aff2">
          <label>2</label>
          <institution>Vrije Universiteit Amsterdam</institution>
          ,
          <addr-line>De Boelelaan 1111, 1081 HV Amsterdam, NL</addr-line>
        </aff>
      </contrib-group>
      <pub-date>
        <year>2024</year>
      </pub-date>
      <abstract>
        <p>The traditional maintenance approach used by manufactures such as Canon and Philips, which relies on service engineers' expertise to diagnose the failure causes, poses significant challenges and costs. To overcome challenges and minimize expenses, we aim to explore the construction and application of a fault knowledge graph that integrate diferent maintenance data and knowledge sources. This involves developing an upper-level ontology based on the requirements for the fault diagnosis of Cyber Physical Systems. This ontology draws inspiration from the Industrial Domain Ontology (IDO) and Industrial Ontology Foundry-Maintenance Reference ontology (IOF-MRO). By leveraging these two ontologies as foundation, we aim to construct a comprehensive framework that captures and represents fault-related knowledge in a structured manner. Additionally, this paper envisions the integration of diferent fault diagnosis methods and knowledge modeling techniques. Combining these approaches is expected to enhance the accuracy and efectiveness of fault diagnosis, leading to more eficient and reliable solutions.</p>
      </abstract>
      <kwd-group>
        <kwd>Fault diagnosis</kwd>
        <kwd>cyber-physical systems</kwd>
        <kwd>knowledge representation</kwd>
        <kwd>knowledge graph</kwd>
      </kwd-group>
    </article-meta>
  </front>
  <body>
    <sec id="sec-1">
      <title>1. Introduction</title>
      <p>
        Machine breakdowns result in a substantial financial burden for manufacturers and their customers,
primarily due to expenses related to training service engineers for fault diagnosis, their salaries, and
the provision of spare parts [
        <xref ref-type="bibr" rid="ref1">1</xref>
        ]. Additionally, the capacity of machines is adversely afected, as they
remain out of service during downtime, further increasing costs and impacting productivity. Therefore,
eficient fault diagnosis is of utmost importance for minimizing both downtime and costs. At Canon
and Philips manufactures, service engineers are trained using valuable documentation and occasionally
videos. However, significant challenges raised with this approach. These challenges include heavy
reliance on the engineers’ expertise, the complexity of navigating extensive documentation, and the
high costs associated with producing and providing instructional videos in terms of time and resources.
      </p>
      <p>To address these challenges, the Zorro project has been initiated, focusing on achieving zero downtime
in Cyber-Physical Systems (CPS). Our goal in this project is to support service engineers in diagnosis
the failure cause. Figure 1 shows the proposed framework designed to achieve this goal. The input
comprises various sources that have been identified through interviews conducted with authorities in
the manufacturing field. In the first phase, a Knowledge Graph (KG) is constructed based on the input.
This involves manually developing an upper-level ontology, inspired by IDO and IOF-MRO. In the next
phase, service engineers observe a symptom that need to be converted into a query for the knowledge
LGOBE</p>
      <p>https://https://github.com/Ameneh71 (A. Naghdi Pour); https://github.com/bennokr/ (B. Kruit);</p>
      <p>CEUR</p>
      <p>ceur-ws.org
graph reasoning. The KG then provides a root cause analysis and the corresponding repair procedure
as the output.</p>
      <p>In addition to the proposed framework, we have envisioned several methods for fault diagnosis
that can ofer significant advantages. Firstly, the automatic generation of Bayesian Networks (BNs)
from KG. The KG excels in data integration, providing a unified view of system faults, while BNs
enable probabilistic reasoning for more accurate diagnosis. This integration allows for a more precise
understanding of fault scenarios and their likelihood, leading to improved diagnostic outcomes. Secondly,
integrating KG with fault tree provides a means to capture complex causal mechanisms. This integration
also facilitates the generation of BNs. Moreover, we envision that KG can be constructed with minimal
efort using Language Models (LLMs). These LLMs can facilitate the integration of diferent fault
diagnosis representations, such as BNs and Fault Trees, thereby enhancing the robustness of CPS by
minimizing downtime. By leveraging the power of this method, we can work towards achieving zero
downtime and ensuring the continuous operation of CPS in the future.</p>
    </sec>
    <sec id="sec-2">
      <title>2. Related work</title>
      <p>
        There are various sources of knowledge and data that can be utilized to support service engineer in
diagnosing failure. These sources include machine log data from sensors, documented knowledge
provided by authorities, logbook data written by service engineers, and also tacit knowledge in the brain
of experts. Researchers have extensively explored diferent categories of these sources and proposed
various methods for supporting maintenance tasks. These methods can be broadly categorized into
four groups: (1) Model-based approach, which is based on constructing an accurate physical model
that captures the dynamic changes within the system. It diagnoses faults by comparing the actual
measurement output of the system with the predicted output of the model, relying on consistency
monitoring. While this method ofers high accuracy, it necessitates the establishment of precise and
quantitative physical models [
        <xref ref-type="bibr" rid="ref2">2</xref>
        ]. (2) Signal-based approach, which diagnoses faults by analyzing and
processing monitored signals. However, it can only be used to identify fault types in key components
that are equipped with sensors [
        <xref ref-type="bibr" rid="ref3">3</xref>
        ]. (3) Quantitative-knowledge-based method utilize historical data to
train a model and treat fault diagnosis as a pattern recognition problem. However, it does rely on a
significant amount of historical fault data to train the model efectively[
        <xref ref-type="bibr" rid="ref4 ref5">4, 5</xref>
        ]. (4) Qualitative
knowledgebased method which adopts a diferent approach by constructing a qualitative model that describes
prior knowledge related to faults. It then utilizes techniques such as searching, matching, and reasoning
to diagnose faults within the system. Unlike the model-based and quantitative-based approaches, this
method does not require the construction of accurate physical models or rely heavily on extensive
historical fault data. Instead, it needs to build a fault knowledge base [
        <xref ref-type="bibr" rid="ref6">6</xref>
        ]. Therefore, considering the
requirements of system-level analysis and the need for searching, matching, and reasoning capabilities,
the qualitative-knowledge-based fault diagnosis approach appears to be a suitable choice for this project.
      </p>
      <p>
        A crucial aspect of qualitative methods is the requirement for a well-defined and reasonable model
that accurately represents knowledge related to faults. The most popular models in the literature
include Rule-Based [
        <xref ref-type="bibr" rid="ref7">7</xref>
        ], Causal Models [
        <xref ref-type="bibr" rid="ref8">8</xref>
        ], Fault Trees [
        <xref ref-type="bibr" rid="ref9">9</xref>
        ], and Petri Nets [
        <xref ref-type="bibr" rid="ref10">10</xref>
        ]. Rule-based models use
if-then rules to represent expert knowledge about system behavior and fault conditions, allowing for
automated diagnosis and decision-making under predefined conditions. Causal models diagnose faults
in CPS by mapping cause-and-efect relationships between system components and events. Fault trees
represent diferent events that can lead to a specific system failure, helping to identify potential causes
and their relationships. Nevertheless, these models have certain limitations. They typically require
prior analysis of potential equipment fault modes and involve manual editing, which makes them
inflexible and challenging to update dynamically. Consequently, the systematic and timely sharing of
maintenance engineers’ experience and expertise in fault diagnosis becomes dificult [
        <xref ref-type="bibr" rid="ref6">6</xref>
        ]. Therefore,
this paper proposes to use knowledge graph technology to mine fault knowledge from vast and diverse
fault documents and then construct a structured and interconnected fault knowledge base.
      </p>
      <p>Documented
Knowledge</p>
      <p>FMEA
Bill of
Materials</p>
      <p>Logbook Data</p>
      <p>Tacit Knowledge
Troubleshooting
Manual</p>
      <p>Phase 1:
Knowledge Graph</p>
      <p>Construction
Upper-level Ontology</p>
      <p>Construction</p>
      <p>Information
Extraction</p>
      <p>Phase 2:
Diagnosis
Symptom
Observation
Querying &amp;
Reasoning</p>
      <p>Output
Root Cause</p>
      <p>Repair
Procedure</p>
    </sec>
    <sec id="sec-3">
      <title>3. Methodology</title>
      <sec id="sec-3-1">
        <title>3.1. Input Source</title>
        <p>Following regular interviews with authorities at Canon and Philips, we have identified various
maintenance sources and categorized them into three groups including data, documented knowledge, and tacit
knowledge. Each of these sources ofers unique insights and information about the system, but they also
have limitations. Data, which is logbook written by service engineers, contains real-life information
regarding specific problems and actions taken to resolve them. However, the information provided
in the logbook may sometimes be incomplete. For instance, engineers may only write “done” as the
action taken without providing detailed explanations. Documented knowledge encompasses three
resources including (1) Bill Of Material, which provides information about the physical structure of
the system, including the location of each part within assemblies or components, but lacks details on
problems that may happen for each part of the system. (2) Failure Mode Efect Analysis, ofers insights
into challenging failure modes and their potential efects, but may not guarantee an accurate and
comprehensive solution for failures. (3) Troubleshooting Manuals, provide insights into the causes of
failures and ofer remedies to resolve them. Lastly, tacit knowledge refers to undocumented knowledge
residing in the minds of experts. These diferent sources are complementary, and relying on just one
of them would not result in an eficient fault diagnosis. By combining them, we can leverage their
strengths and compensate for their limitations.</p>
      </sec>
      <sec id="sec-3-2">
        <title>3.2. Knowledge Graph Construction</title>
        <p>
          The first phase involves two steps to construct the knowledge graph: Upper-level ontology construction
and Information Extraction. The upper-level ontology has been manually created to serve as the
foundational structure for organizing the schema of the knowledge graph. This involved extensive
analysis of various input sources to identify the most valuable knowledge. Additionally, the concepts
and terminology have been carefully selected to ensure clarity and consistency throughout the ontology.
We also drew inspiration from the IDO and IOF-MRO in developing our fault diagnosis ontology. IDO is
a recent work item, approved by the ISO TC 184/SC4 Industrial Data committee in July 2023, and holds
significance in the realm of industrial standardization. IOF-MRO is to support semantic interoperability
through the use of modular ontologies in the maintenance domain. Due to limited space, more detailed
information on the IDO and IOF-MRO models can be found in [
          <xref ref-type="bibr" rid="ref11">11</xref>
          ] and [
          <xref ref-type="bibr" rid="ref12">12</xref>
          ] respectively. Figure 2
shows the design of the Zorro ontology, where there are classes (nodes) and relationships (edges)
that represent the domain of interest. There is a class named “Component” that can represent a part,
depensOn
        </p>
        <p>subFunction
subComponent
hasFunction
define</p>
        <p>hasCause
Component
involve</p>
        <sec id="sec-3-2-1">
          <title>Function</title>
          <p>failVia</p>
        </sec>
        <sec id="sec-3-2-2">
          <title>Step</title>
        </sec>
        <sec id="sec-3-2-3">
          <title>Problem</title>
          <p>solve</p>
        </sec>
        <sec id="sec-3-2-4">
          <title>Solution</title>
          <p>consistOf
resultIn</p>
        </sec>
        <sec id="sec-3-2-5">
          <title>Procedure</title>
        </sec>
        <sec id="sec-3-2-6">
          <title>Effect</title>
          <p>address</p>
          <p>Workaround
subClassOf
assembly, or subsystem, each serving a specific “ Function”. When a part encounter malfunction,
it leads to the occurrence of a “Problem”. The problem has cause(s), which can be considered as
problem, result in a certain “Effect”. To address these problems, there are two types of “Procedure”
that can be implemented. The first is a “ Solution”, which directly solves the problem at hand. The
second is a “Workaround”, which aims to address the efects caused by the problem. Both procedures
consist of multiple “Step”, with each step involving a specific part of the system. For a thorough
understanding, Table 1 provides a depiction of the classes, their definitions and the sources containing
relevant information about each class, along with an example of the classes in real field. We also
compared our defined classes with the IDO and IOF-MRO. On the other hand, Table 2 illustrates the
object properties, including their definitions and comparison. For the information extraction step,
diferent techniques such as Regular Expression, Named Entity Recognition, and LLMs, have been
utilized to extracted required knowledge and populate it based on the ontology.</p>
        </sec>
      </sec>
      <sec id="sec-3-3">
        <title>3.3. Diagnosis</title>
        <p>The next phase, diagnosis, shows the application of the proposed method in which service engineers
observe symptoms of the failure, which should be converted to a query for KG-based reasoning. As a
result, a diagnosis which find the root cause of the issue along with a procedure should be suggested to
solve the problem. To this end, we are planning to develop querying and reasoning systems for diagnosis,
with the aim of integrating or supporting diferent fault diagnosis reasoning techniques, such as BNs
and Fault Trees. Crucially, such systems will need to take into account the maintenance engineers’
expert knowledge in order to augment their ability. However, integrating their tacit knowledge into the
diagnosis process is an open research question. We urge the community to engage in this challenge,
leveraging semantic technologies to enhance fault diagnosis and ensure operational resilience.</p>
      </sec>
    </sec>
    <sec id="sec-4">
      <title>4. Discussion</title>
      <p>The related work section has extensively analyzed the advantages and disadvantages associated with
various fault diagnosis methods and knowledge modeling techniques. Additionally, the rationale for
constructing a knowledge graph as the underlying model to capture and represent prior knowledge has
been explained. However, we believe that the combination of fault diagnosis methods and knowledge
modeling techniques holds great potential for enhancing overall capabilities by leveraging the strengths</p>
      <p>IDO: InAnimatePhysicalObject DC servo
moIOF-MRO: MaintainableMateri- tor
alItem
IDO: Function Feeding paper
IOF-MRO: MaintainableMateri- to printer
alItemRole
IDO: - Overheating
IOF-MRO: FailedState
IDO:
IOF-MRO: FailureEfect</p>
      <p>Wear and tear
IDO: - Check and
IOF-MRO: PlannedProcess clean the</p>
      <p>cooling fan
IDO: - Check and
IOF-MRO: MaintenanceActivity clean the</p>
      <p>cooling fan
IDO: - Replace
IOF-MRO: SupportingMainte- damaged
nanceActivity components
closer to
motor</p>
      <p>Replace
IDO:
IOF-MRO:
MaintenanceWorkOrderRecord
Definition and Source</p>
      <p>Close Match</p>
      <p>
        Example
of each approach. We have identified three specific combinations that hold promise in enhancing fault
diagnosis:
1. Automatically generating a Bayesian Network from our knowledge graph: data integration from
various sources is a crucial task for eficient fault diagnosis. While BNs face challenges in data
integration [
        <xref ref-type="bibr" rid="ref13">13</xref>
        ], KG excel in this aspect, allowing for a unified and comprehensive view of the
system’s faults. On the other hand, BNs ofer a robust framework for probabilistic reasoning,
enabling more accurate diagnosis in the presence of uncertainty. By leveraging the probabilistic
capabilities of BNs, we can enhance the fault diagnosis process, considering the likelihood of
diferent fault scenarios and their potential impact on the system. This combination harnesses
the strengths of both approaches, enabling a more comprehensive and accurate fault diagnosis
methodology.
2. Integrating our knowledge graph representation with fault tree: The ontology now contains
only simple causal links, but often there is a more complex causal mechanism. Sometimes, faults
only occur when multiple events occur simultaneously, or under specific conditions (such as
humidity). Other times, faults have separate, orthogonal causes. These structures are often
modeled in fault trees. We envision that these structures can also be modeled in a KG, at various
levels of granularity, and that Fault Trees can be generated from them. Additionally, if fault trees
exist that model certain mechanisms, they could be useful sources of information to be linked
and integrated into the KG. Then, their content can be used to generate Bayesian Networks as
described above.
3. Combining model-based with quantitative fault diagnosis methods: In section 2, we have
described the drawbacks of these two methods. Both exist on either ends of knowledge-to-data
spectrum: on one end, the model-based diagnosis requires detailed (physical) knowledge of the
system, and on the other end, quantitative fault diagnosis requires comprehensive observation
data to learn from. However, in most cases only a little of either is available, and it is dificult
to integrate the physical models with the observed data. We envision that the extraction of
fault diagnosis knowledge from diverse sources will aid the construction of models that are
both physically informed and data-driven. To this end, the Knowledge Graph facilitates the
integration of various views of historically collected (sensor) data within unified physical, logical
and functional views of the CPS. We envision that this will significantly reduce the eforts needed
to construct accurate models, by re-using modular model components, simplifying the data
analysis pipeline, and allowing eficient validation on historical maintenance data.
      </p>
    </sec>
    <sec id="sec-5">
      <title>5. Conclusion and Future work</title>
      <p>In this study, various fault diagnosis approaches were reviewed, and a framework consisting of two
primary phases, Knowledge Graph Construction and Diagnosis, was developed. By constructing a
knowledge graph using diverse input sources, accurate diagnosis and eficient repair procedures can
be achieved. In future work, the focus will be on refining and automating the construction of the
knowledge graph using advanced techniques like LLMs. Additionally, the transformation of KG into
Bayesian Network will be explored to have a probabilistic reasoning. Furthermore, the construction of
model-based and quantitative-based fault diagnosis methods using the knowledge graph will also be
investigated.</p>
    </sec>
    <sec id="sec-6">
      <title>Acknowledgments</title>
      <p>This publication is part of the project ZORRO with project number KICH1.ST02.21.003 of the research
programme Key Enabling Technologies (KIC) which is (partly) financed by the Dutch Research Council
(NWO).</p>
    </sec>
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