{"labels":{"en":"Deep Learning-Enhanced Detection of Lie Tendencies through Answer Pattern Analysis"},"descriptions":{"en":"scientific paper published in CEUR-WS Volume 3900"},"claims":{"P31":"Q13442814","P1433":"Q134028992","P1476":{"text":"Deep Learning-Enhanced Detection of Lie Tendencies through Answer Pattern Analysis","language":"en"},"P407":"Q1860","P953":"https://ceur-ws.org/Vol-3900/Paper16.pdf","P50":[],"P2093":[{"value":"Debanil Chanda","qualifiers":{"P1545":"1"}},{"value":"Rakesh Kumar Mandal","qualifiers":{"P1545":"2"}}]}}