{"version.version":"0.0.7","version.cm_url":"https://github.com/ceurws/ceur-spt","spt.html_url":"/Vol-4053/S_43_Ierofeiev_Sinitsyn_Slabospitska.html","spt.description":null,"spt.id":"Vol-4053/S_43_Ierofeiev_Sinitsyn_Slabospitska","spt.wikidataid":null,"spt.title":"\n                    Embedded Software Testing Issues and Addressing them with Software Product Lines Paradigm\n                ","spt.pdfUrl":"https://ceur-ws.org/Vol-4053/paper2.pdf","spt.volume":{"number":4053,"acronym":"SEST 2025","wikidataid":null,"title":"Proceedings of the 1st Workshop Software Engineering and Semantic Technologies (SEST 2025)","description":null,"url":null,"date":"2025-10-05","dblp":null,"k10plus":null,"urn":null},"spt.session":null,"cvb.id":"Vol-4053/S_43_Ierofeiev_Sinitsyn_Slabospitska","cvb.title":"\n                    Embedded Software Testing Issues and Addressing them with Software Product Lines Paradigm\n                ","cvb.type":null,"cvb.position":null,"cvb.pagesFrom":null,"cvb.pagesTo":null,"cvb.authors":"Iurii Ierofeiev,Igor Sinitsyn,Olha Slabospitska","cvb.vol_number":"4053","cvb.pdf_name":"paper2.pdf","cvb.pages":"13-23","cvb.fail":null}