{"labels":{"en":"\n                    Embedded Software Testing Issues and Addressing them with Software Product Lines Paradigm\n                "},"descriptions":{"en":"scientific paper published in CEUR-WS Volume 4053"},"claims":{"P31":"Q13442814","P1433":null,"P1476":{"text":"\n                    Embedded Software Testing Issues and Addressing them with Software Product Lines Paradigm\n                ","language":"en"},"P407":"Q1860","P953":"https://ceur-ws.org/Vol-4053/paper2.pdf","P50":[],"P2093":[{"value":"Iurii Ierofeiev","qualifiers":{"P1545":"1"}},{"value":"Igor Sinitsyn","qualifiers":{"P1545":"2"}},{"value":"Olha Slabospitska","qualifiers":{"P1545":"3"}}]}}