=Paper= {{Paper |id=None |storemode=property |title=Using extended metadata model OMV and metrics in OntoLP Portal |pdfUrl=https://ceur-ws.org/Vol-596/paper-15.pdf |volume=Vol-596 }} ==Using extended metadata model OMV and metrics in OntoLP Portal== https://ceur-ws.org/Vol-596/paper-15.pdf
                                                                  Vol-596
                                              urn:nbn:de:0074-596-3
                                              C opyright © 2010 for the individual
                                              papers    by  the   papers'     authors.
                                              C opying permitted only for private and
                                              academic purposes. This volume is
                                              published and copyrighted by its
                                              editors.




ORES-2010
Ontology Repositories and Editors for
the Semantic Web

Proceedings of the 1st Workshop on Ontology Repositories and
Editors for the Semantic Web

Hersonissos, Crete, Greece, May 31st, 2010.


Edited by

Mathieu d'Aquin, The Open University, UK
Alexander García Castro, Universität Bremen, Germany
Christoph Lange, Jacobs University Bremen, Germany
Kim Viljanen, Aalto University, Helsinki, Finland




10-Jun-2010: submitted by C hristoph Lange
11-Jun-2010: published on C EUR-WS.org
    Using extended metadata model OMV and
            metrics in OntoLP Portal

         Anderson Bestteti, Larissa A. de Freitas, and Renata Vieira

                          College Computer, PPGCC,
      Ipiranga Avenue, 6681, Partenon, Building 32, Porto Alegre, RS, Brazil
        {anderson.bestteti,larissa.freitas,renata.vieira}@pucrs.br
                    http://www.inf.pucrs.br/~linatural/



      Abstract. This paper describes the application of OMV-R, an extension
      of the OMV metadata model for describing ontologies. The motivation
      is to help users searching for ontologies and ontology research related
      resources for reuse. In our extension we included information about on-
      tology evaluation and evolution and we also propose more elaborated
      ways for describing ontology metrics. The extended model was applied
      to a web portal for Portuguese ontologies, OntoLP. The model was im-
      plemented and evaluated through questionnaires answered by users, re-
      searchers and ontology engineers.

      Key words: Metamodel, Metrics, Ontology Repository, Ontology Reuse


1   Introduction
One of the main features of ontologies is to enable humans and machines to
communicate through semantic formalization. With this purpose, ontologies are
used in many areas of Computer Science, such as artificial intelligence, database
and software engineering. It has been also the key component for information
systems in a increasing variety of domains, well-known examples are the areas
of biology, geography and law.
    The Semantic Web Project contributed for popularization of ontology as an
artifact to build the knowledge representation, shared and reused. With the reuse
of ontologies costs can be reduced, mainly in development phase.
    As presented in [9], the reuse of ontologies can be seen from two main points:
one is to create, extend, specialize and adapt an ontology to build a new one;
the other is to combine different ontologies in a single one.
    A first problem for reuse is ontology search. Usually, repositories offer poor
navigation interfaces [2]. The lack of good quality documentation about available
ontologies also contributes to this difficulty. The Metadata models that describe
ontologies have been proposed to deal with these problems[6]. The use of a
standard vocabulary for ontologies is understood as a basic requisite for a good
description of ontologies on the Web.
    In this paper we extend and evaluate the previously proposed OMV meta-
data model through its application to a portal for Portuguese ontologies. The
2        Anderson Bestteti, Larissa A. de Freitas, Renata Vieira

motivation is to help users searching for ontologies and ontology research related
resources.
    The paper is organized as follows: in Section 2 we present our extension which
we call OMV-R; in Section 3 we describe a set of ontology metrics that we use
in the description of the ontologies in our portal; in Section 4 we discuss the
evaluation of the model; finally, in Section 5 we show the conclusion and future
works.


2      The extended metadata model OMV-R

Our extension of the OMV model and its application to a portal aims to assist
users in the process of finding out ontologies for reuse.
    The original model proposed by [8] does not include information about on-
tology evaluation and evolution. We included those elements in the model and
we also propose more elaborated ways for describing ontology metrics.
    According to [13], metrics are useful to help evaluate ontologies during the
build and application phase, enabling a quick and simple understanding about
what are being modeled through these structures and facilitating the control of
its future evolution. This also holds for ontology reuse.
    In [10] a study is performed about the maturity of the current process,
methodologies and tools focused on ontology reuse. Their strengths and require-
ments are identified.
    Specifically on the evaluation of ontologies, [16] presents a methodology called
Requirements-Oriented Methodology for Evaluation Ontologies (ROMEO). This
methodology propose a set of criteria for ontology evaluation. Inspired by these
previous works, we considered that ontology evaluation is another important
feature in the ontology selection process.
    As OMV does not provide such information so important to enable reuse, we
extended it with new classes as shown in Figure 1.


2.1     Description of the new classes, properties and relations

This section will present the classes, properties and relations such as were added
to metadata model OMV.

OntologyEvaluation Class: this class represents the evaluation of an ontology.
The properties of this class are:

    – evaluationComments: free text that can be used to comment the evaluation
      criteria;
    – evaluationDate: date when the evaluation was made;
    – evaluationValue: value assigned to evaluation criteria.
       Using extended metadata model OMV and metrics in OntoLP Portal          3




                    Fig. 1. Extended OMV metadata model .


EvaluationCriteria Class: this class represents the evaluation criteria used
to evaluate the ontology. In our implemented model, this class has an evaluation
criteria set as discussed in [16]. The properties of this class are:
 – criteriaQuestion: question describing the evaluation criteria;
 – criteriaType: define whether a question accept a textual or numeric answer.

Metric Class: this class represents metrics. Such metrics can be used to score
an ontology, assigning a quantitative value, in order to assist users to select
ontologies. In OMV-R there are 20 implemented metrics, which will be discussed
in the next subsection. The properties of this class are:
 – name: metric name;
 – usages: free text to describe and guide the user how to use the metric as well
   how the metric results may be interpreted.

OntologyMetric Class: this class represents instances of the calculated met-
rics of an ontology. One or more metrics may be assigned to an ontology, they
can help users to select ontologies on the basis of different points of view. The
properties of this class are:
 – comments: free text to give more information about a metric;
 – creationDate: date when the metric was calculated;
 – value: value assigned to a metric.
4         Anderson Bestteti, Larissa A. de Freitas, Renata Vieira

Project Class: this class represents research or commercial projects that use a
given ontology or a set of them. The properties of this class are:

    – creationDate: date of the project’s beginning;
    – description: free text to describe the project’s objectives and artifacts pro-
      duced by them;
    – name: the project’s name.

Relations: here we present the relations among these new classes.

    – evaluatedOntology: relation between ontologies with their respective ratings;
    – isBasedOn: reference to another ontology which was used in its construction,
      this reference allows to identify the reuse level that one ontology has, based
      on the quantity of references;
    – hasEvaluator: reference to a research group or enterprise responsible by on-
      tology evaluation;
    – evaluationCriteria: reference to an evaluation criteria associated to an ontol-
      ogy;
    – hasSponsor: reference to the institution sponsoring the project;
    – usedByProject: reference to the project that uses an ontology;
    – hasCreator: reference to the research group or institution that has developed
      the metric;
    – usedMetric: reference to the metric assigned to a given ontology.

    From the adaptation made, the OMV-R supports now the ontology eval-
uation description according to the methodologies proposed by [10], [16] and
[13]. Another contribution is to allow OMV-R to store new metrics whenever
is needed. These metrics may be used to evaluate an ontology over different
points of view. Finally, it is expected that the extended model OMV-R provides
a greater flexibility in the search of ontologies, as it offers to users additional
information about reuse.
    In the next section we described the set of implemented metrics.


3      Implemented Ontology Metrics

The model has been extended to accommodate a more elaborated description
through metrics. In our application of the model we have implemented ways of
calculating a set of metrics to describe the ontologies in the repository. The choice
of metrics were based on a detailed systematic review of the literature of ontology
metrics. Following the systematic review their presentation was standardized in
a common representation formalism, where C is used for classes, CS is used for
set classes with subclasses, CR is used for set of root classes, CL is used for set
of leaf classes, H C (CRj , CLi ) for hierarchy of classes where CRj is a subclass
of CLi , prop for the function that relates the classes in a non-hierarchy and att
for the function that relates classes with literal values (string), I for instances
and inst(C) for the function of instantiated classes [13] [12].
       Using extended metadata model OMV and metrics in OntoLP Portal          5

    Besides, we use Count for count, SuperClass for superclass function, SubClass
for subclass function, M ax for maximum (M axDepth and M axW idth), Depth
for depth, W idth for width, Avg for average (AvgDepth, AvgM axAvg, AvgW idth,
AvgAttClass, AvgP ropClass, AvgP Class, AvgCRC, AvgCRCL, AvgCIC,
AvgIC) and StdDev for standard deviation (StdDevIC).
    All chosen metrics presented result in numeric values and their calculation
could be implemented. The metrics were separated in three groups as follows:

1. Group 1 is simply the count of the basic elements of an ontology (classes,
   properties, and instances), metrics 1 to 7.

   Number of root classes [15] [1]

                                Count(CR) = |CR|                            (1)
                         where: |CR| is the set cardinality

   Number of leaf classes [15] [1] [14]

                                Count(CL) = |CL|                            (2)
                         where: |CL| is the set cardinality

   Number of classes [7] [1] [14]

                                    Count(C) = |C|                          (3)
                          where: |C| is the set cardinality

   Number of properties (attributes) [1]

                                 Count(att) = |att|                         (4)
                         where: |att| is the set cardinality

   Number of properties (relations) [1]

                               Count(prop) = |prop|                         (5)
                         where: |prop| is the set cardinality

   Number of properties [7] [1] [14]

                             Count(att) + Count(prop)                       (6)

   Number of instances

                                    Count(I) = |I|                          (7)
                          where: |I| is the set cardinality
2. Group 2 represents the depth and width of the structure, metrics 8 to 12.
6      Anderson Bestteti, Larissa A. de Freitas, Renata Vieira

    Maximum depth [7] [1] [14]


                                 M axDepth(H C ) =                             (8)
              the major ontology depth counted from each
                                root class (CRj )

    Average depth [1] [4] [15]


                                 AvgDepth(H C ) =                              (9)
         the average ontology depth added from all root classes (CR)
                       by counted from each leaf class (CLi )

    Average maximum depth to average depth [14]



              AvgM axAvg(H C ) = M axDepth(H C )/AvgDepth(H C )             (10)

    Maximum width [1]


                                 M axW idth(H C ) =                         (11)
              the major ontology width counted from each
                            class with subclass (CSk )

    Average width [1]



                                 AvgW idth(H C ) =                          (12)

     the average ontology width added from all classes with subclasses (CS)
                 by counted from each class with subclass (CSk )

3. Group 3 represents the calculation of simple averages and standard deviation
   from combinations of the basic elements, metrics 13 to 20.

    Average number of properties (attributes) to total number of classes [1]

                        AvgAttClass = Count(att)/Count(C)                   (13)

    Average number of properties (relations) to total number of classes [1] [14]

                     AvgP ropClass = Count(prop)/Count(C)                   (14)

    Average number of properties to total number of classes [1]
       Using extended metadata model OMV and metrics in OntoLP Portal           7

              AvgP Class = (Count(att) + Count(prop))/Count(C)                (15)

    Average number of leaf classes to total number of classes [1] [14] [13]

                        AvgCRC = Count(CR)/Count(C)                           (16)

    Average number of leaf classes to number of classes root [14]

                       AvgCRCL = Count(CR)/Count(CL)                          (17)

    Average number of classes populated to total number of classes [13]

                    AvgCIC(H C ) = Count(inst(C))/Count(C)                    (18)

    Average of the total number of instances to total number of classes

                        AvgIC(H C ) = Count(I)/Count(C)                       (19)

    Standard deviation of the total number of instances to total number of
    classes [13]
                          qX
       StdDevIC(H C ) =         (Count(inst(C)) − AvgIC(H C ))2 /Count(I)
                                                                           (20)

    The AvgIC(H C ) and Count(I) were calculated and used in StdDevIC(H C ).
It is not directly referenced in papers obtained in the systematic review.
    Note that OMV documentation refer to four metrics only: number of class,
number of property, number of individuals and number of axioms.


4   Application evaluation
OntoLP Portal1 offers ontologies and ontology research related resources, with
special preference to ontologies written in Portuguese language. At Home link
the objectives of the portal are shown, whilst the link Resources list ontologies
and related works. The link About contains information referring to the research
group involved in this project. Through the Contact link others research groups
in the field can send their works and suggestions. Finally, the link Links shows
researches groups that have been colaborated directly or indirectly with the
OntoLP Portal as well as events related with ontology research.
    An ontology search was performed just to build the repository. We conducted
searches in Google 2 specifying the type of query (e.g. “field filetype: owl”), in
Swoogle 3 , in OntoSelect 4 and pages of projects and research groups work-
ing with the subject. Also we announce the OntoLP portal in several Brazilian
1
  http://www.inf.pucrs.br/˜ ontolp/index.php
2
  http://www.google.com.br/
3
  http://swoogle . umbc.edu /
4
  http://olp.dfki.de/ontoselect/
8       Anderson Bestteti, Larissa A. de Freitas, Renata Vieira

research lists and organized an event with the intention of receiving these re-
sources.
    As a result we find resources in different domains such as ecology, nanotech-
nology, art, curriculum, emotion, privacy, network of scientific knowledge, smart-
phones, music and stimulus equivalence. Today the OntoLP portal has 25 ontolo-
gies. Note that the currently portal does not use any advanced structure, such
as a metamodel, to store the descriptions of ontologies. Such descriptions were
manually built and hard coded in HTML, which are stored in the file system
on the Web server. In order to improve the current services of OntoLP portal,
a new prototype application was developed that uses the OMV-R to keep the
descriptions of ontologies. The next subsection will take a look deeper how this
new version of OntoLP portal was developed.

4.1   Infrastructure
A tool has been developed in order to automate the receiving process. This
tool reads the ontology and includes information about ontology metrics. It has
also another interface for the inclusion of other metadata, to be used in the
description of ontologies in the OntoLP Portal, that corresponds with instances
of OMV-R. Ontologies are thus received through a submission form. Figure 2
shows the flow of information during the ontology reception process.




               Fig. 2. Flow to store an ontology into OntoLP Portal.


    Besides the ability to create OMV-R’s instances, the tool offers others ser-
vices such as information retrieval of the ontologies, ability to create and retrieve
ontology evaluation instances as well as the metrics values for each OMV-R in-
stance that represents a description of the ontology. The recovery of information
from ontologies is made through a set of methods that read data from OMV-R
and then, record the information on a XML file wich will be used by presen-
tation layer of the prototype application. Therefore, this XML file works like a
communication area between OMV-R ontology and end user interface.
    Finally, the tool uses the Jena’s SPARQL query engine to implement the
advanced search service in the OntoLP Portal. The query is performed on the
OMV-R, specifically over the Ontology class to retrieve all the ontologies that
match the user’s filter.
       Using extended metadata model OMV and metrics in OntoLP Portal          9

    Figure 3 presents the OMV-R metric instances for the stored ontologies.
Notice that the OntoLP Portal prototype application can be accessed through
following link: http://www.ontolp.com.br. Both versions of portals are available
for readers to discover the differences between portals (take a look at previous
page on footnote for the URL of the current portal).




         Fig. 3. Portal OntoLP interface showing an instance of OMV-R.




4.2   Evaluation

We applied two questionnaires to evaluate the adaptations made to the portal
which follows the new proposed model.
    The goal of the first questionnaire was to evaluate the opinion of a users’
group, researchers and engineering of ontologies about the usefulness of metrics
in specific repositories, in this case in OntoLP portal.
    In the first phase, the questionnaire (in print format) was applied to people
in national workshop about ontologies. In the final phase the questionnaire (in
digital format) was applied to visitors of the OntoLP portal. The questionnaire
was available for a month (December 6, 2009 until January 6, 2010).
    The final result showed that 76 % respondents have developed ontologies, 83
% have searched for ontologies written in English, Portuguese, or Spanish. The
language most cited was English and Portuguese was in the second position. The
sample consisted of 14 PhD, 11 MSc and 5 senior experts. At last, ontologies in
many domains were mentioned.
10     Anderson Bestteti, Larissa A. de Freitas, Renata Vieira

    We observed that there was no preference regarding groups 1, 2 and 3, their
usefulness was better appreciation as a whole. Most people consider the use of
metrics important for the portal.
    The respondents commented about the lack of more specific metrics (total
number of relations’ types, where such relations would be “ is-a”, “ part-of”)
and about the lack of the presentation in percentages the results (percentage of
classes that did not have superclasses). These suggestions will be considered as
future work.
    The goal of the second questionnaire was to get impressions about the new
services of the OntoLP Portal such as description and retrieval of ontologies
based on the OMV-R metadata.
    Here, the sample was formed by 19 respondents. They were instructed to visit
the OntoLP Portal and to evaluate the new services such as ontology submission
and search. Next, the respondents were oriented to compare the services of the
current version of the portal. When asked whether these new services have eased
the ontology search process, about 58% of respondents agreed, 26% remained
neutral and about 15% disagreed.
    Despite some disagreement about how easy is to locate ontologies in the
new OntoLP Portal, about 95% of respondents believe that the new ontology
submission and search services are better than the original one.
    In addition to the two close questions about the satisfaction and improvement
about the ontology search services, the respondents were conducted to comment
referring to other information that could be added to the metadata model OMV-
R. About 25% of respondents have contributed with suggestions; 32 % said that
the new set of the model’s information was sufficient or reasonable; and 36 %
didn’t answer.
    The suggestions are related mainly with the ontology domain, and this infor-
mation is the best way to locate ontologies. Other respondent claimed that the
new portal should offer information about the relationship among ontologies, as
evidence: “At first glance I would say that at some point we will need a hierarchy
of ontologies (when there are more than 20 or 30 ontologies) and some mechanism
to relate them (meta-ontology)”. Notice tha both questionaries can by accessed
through the following links: http://www.inf.pucrs.br/˜ontolp/questionario.php
(for metric’s questions) and http://www.ontolp.com.br/questionarioOMVR.php
(for metamodel and prototype application’s questions)


5    Conclusion and Future Work

This paper presented an extended model based on OMV, which is called OMV-
R. The new model includes key ontology metrics identified through literature
review. The model was applied to OntoLP portal which aims to maintain and
distribute Portuguese resources. The model is used for the description of the
resources, and was also useful as a basis for new search and retrieval services.
Finally, this paper discussed the surveys performed to evaluate the model, the
new portal and the use of metrics, where the objective was to assess with the
        Using extended metadata model OMV and metrics in OntoLP Portal             11

community the benefits and contributions of the model for ontology description
and location as well as the process of reuse of such resources.
    We hope to have contributed with ideas for describing ontologies that can
be included in previously proposed standards. We have also shown its usefulness
for the development of software that can help researchers and engineers to find
and inspect available ontologies in an organized and efficient way.
    Potential future work are: (i ) adaptation of the OMV-R API to work with
the OMV-R model stored in commercial database as well as free ones; (ii ) the
development of Web services for distributed applications; (iii ) improving the ad-
vanced search interface of the new OntoLP Portal, in order to allow users query
any property of the metamodel through free-text. Nowadays only three proper-
ties have been added to advanced search interface; (iv ) building mechanisms for
visualization of ontologies described in the metadata model OMV-R.


References

1. Cross, V., Pal A.: Metrics for ontologies. In: Annual Meeting of the North American
   Fuzzy Information Processing Society, pp. 448-453, (2005).
2. Ding, L. Finin, T. Joshi, A. Pan, R. Cost, R. S. Peng, Y. Reddivari, P. Doshi, V.
   Sachs, J.: Swoogle: A Semantic Web Search and Metadata Engine. In: Proceed-
   ings of the thirteenth ACM international conference on Information and knowledge
   management, pp. 652-659, (2004).
3. Fensel, D., van Harmelen, F., Horrocks, I., McGuinness, D., Patel-Schneider, P.:
   OIL: An Ontology Infrastructure for the Semantic Web. IEEE Intelligent Systems,
   v. 16, pp. 38-45, Mar./Apr., (2001).
4. Gangemi, A., Catenacci, C., Ciaramita, M., Lehmann, J.: Modelling ontology eval-
   uation and validation. In: The Semantic Web: Research and Applications, pp. 140-
   154, (2006).
5. Gruber, T. R.: Toward principles for the design of ontologies used for knowledge
   sharing. International Journal of Human Computer Studies 43, 907-928 (1995).
6. Hartmann, J.; Bontas, E. P.; Palma, R.; Gmez Prez, A.:Demo - Design Environment
   for Metadata Ontologies. In: The Semantic Web: Research and Applications, pp.
   427-441, (2006).
7. Lozano-Tello, A., Gmez-Prez, A.: Ontometric: A method to choose the appropriate
   ontology. Journal of Database Management 15, 1-18 (2004).
8. Palma, R.; Hartmann, J.; Haase, P.: OMV Report 2.4 - Ontology Metadata Vocab-
   ulary for the Semantic Web. Technical Report, p. 94, (2008).
9. Pinto,H. S, Martins J. P.: Reusing Ontologies. In: AAAI 2000 Spring Symposium
   Series, Workshop on Bringing Knowledge to Business Processes, pp. 77-84, (2000).
10. Simperl, E.: Reusing Ontologies on the Semantic Web: A Feasibility Study. Data
   and Knowledge Engineering, v. 68-10, pp. 905-925, October, (2009).
11. Smith,M. K., Welty, C. , McGuinness,D. L.: OWL Web Ontology Language Guide:
   W3C Recommendation 10 February 2004.
12. Tartir, S., Arpinar, I.B., Moore, M., Sheth, A. P., Aleman-Meza, B.: OntoQA:
   Metric-based ontology quality analysis?. In: IEEE Workshop on Knowledge Acqui-
   sition from Distributed, Autonomous, Semantically Heterogeneous Data and Knowl-
   edge Sources, p. 9, (2005).
12     Anderson Bestteti, Larissa A. de Freitas, Renata Vieira

13. Tartir, S., Arpinar, I.B.: Ontology Evaluation and Ranking using OntoQA. In:
   First IEEE International Conference on Semantic Computing, pp. 185-192, (2007).
14. Yang, Z., Zhang, D., Ye, C.: Evaluation Metrics for Ontology Complexity and
   Evolution Analysis. In: IEEE International Conference on e-Business Engineering,
   pp. 162-170, (2006).
15. Yao, H., Orme, A.M., Etzkorn, L.: Cohesion metrics for ontology design and ap-
   plication. Journal of Computer Science 1, 107-113 (2005).
16. Yu, J. Thom, J. A. Tam, A.: Requirements-Oriented Methodology for Evaluating
   Ontologies. Information Systems, v. 34-8, pp. 766-791, December, (2009).