Vol-1175⫷ Vol-1176 ⫸Vol-1177
urn:nbn:de:0074-1176-0


Vol-1176/CLEF2010wn-PAN-DeviEt2010⫷Vol-1176/CLEF2010wn-PAN-Gottron2010⫸Vol-1176/CLEF2010wn-PAN-MicolEt2010

External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN at CLEF 2010