Vol-3922⫷ Vol-3923 ⫸Vol-3924
urn:nbn:de:0074-3923-0


Vol-3923/Paper_1⫷Vol-3923/Paper_2⫸Vol-3923/Paper_3

GenAI or not GenAI ? Comparing AI methodologies to solve Defect Wafer Map Classification Problem Consciousness (short paper)