Vol-4181⫷ Vol-4182 ⫸Vol-4183
urn:nbn:de:0074-4182-0


Vol-4182/paper17⫷Vol-4182/paper26⫸Vol-4182/paper28
Loredana CristaldiEmilia LenziDavide MartinenghiLuca MartiriAndrea MoschettiLetizia TancaMarco Zanoni

Optimizing Defect Detection: A Machine Learning-Ready Data Processing Pipeline